Search results

  1. 1.
    0386402 - ÚPT 2013 RIV CZ eng G - Proceedings (international conference)
    Mika, Filip (ed.)
    Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation.
    Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012. 78 s. ISBN 978-80-87441-07-7.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
    Institutional support: RVO:68081731
    Keywords : charged particle optics * surface physics instrumentation
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0215704
     
     
  2. 2.
    0352973 - ÚPT 2011 RIV CZ eng G - Proceedings (international conference)
    Mika, Filip (ed.)
    Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation.
    Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010. 70 s. ISBN 978-80-254-6842-5.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : charged particle optics * surface physics instrumentation
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0192337
     
     
  3. 3.
    0315388 - ÚPT 2009 RIV CZ eng G - Proceedings (international conference)
    Mika, Filip (ed.)
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation.
    [Současné trendy v elektronové optice a přístrojové technice pro povrchovou fyziku.]
    Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008. 110 s. ISBN 978-80-254-0905-3.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : Charged Particle Optics * Surface Physics Instrumentation
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0165602
     
     
  4. 4.
    0109035 - UPT-D 20040036 RIV CZ eng G - Proceedings (international conference)
    Müllerová, Ilona (ed.)
    Proceedings of the 9th International Seminar Recent Trends in Charged Particle Optics and Surface Physics Instrumentation.
    [Sborník devátého mezinárodního semináře o nových trendech v optice nabitých částic a v přístrojové technice pro povrchovou fyziku.]
    Brno: Institute of Scientific Instruments AS CR, 2004. 80 s.
    [Recent Trends /9./ in Charged Particle Optics and Surface Physics Instrumentation. Skalský Dvůr (CZ), 12.07.2004-16.07.2004]
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : Charged Particle Optics at * Surface Physics Instrumentation
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0016147
     
     
  5. 5.
    0049029 - ÚPT 2011 RIV CZ eng G - Proceedings (international conference)
    Müllerová, Ilona (ed.)
    Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation.
    [Sborník 10. Mezinárodního semináře o současných trendech v optice nabitých částic a přístrojové technice pro fyziku povrchů.]
    Brno: Ústav přístrojové techniky AV ČR, v. v. i., 2006. 72 s. ISBN 80-239-6285-X.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : international seminar * charged particle optics * surface physics instrumentation
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0139526
     
     


  This site uses cookies to make them easier to browse. Learn more about how we use cookies.