Search results
- 1.0583098 - ÚFP 2024 RIV US eng J - Journal Article
Tolias, P. - Komm, Michael - Ratynskaia, S. - Podolník, Aleš
ITER relevant multi-emissive sheaths at normal magnetic field inclination.
Nuclear Fusion. Roč. 63, č. 2 (2023), č. článku 026007. ISSN 0029-5515. E-ISSN 1741-4326
R&D Projects: GA MŠMT(CZ) EF16_013/0001551
EU Projects: European Commission(BE) 101052200
Institutional support: RVO:61389021
Keywords : emissive sheath * escaping current density * macroscopic melt motion * Schottky effect * secondary electron emission * thermionic emission
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 3.3, year: 2022
Method of publishing: Open access
https://iopscience.iop.org/article/10.1088/1741-4326/acaabd
Permanent Link: https://hdl.handle.net/11104/0351096
Research data: Zenodo - 2.0536450 - ÚFP 2021 RIV NL eng J - Journal Article
Tolias, P. - Komm, Michael - Ratynskaia, S. - Podolník, Aleš
Origin and nature of the emissive sheath surrounding hot tungsten tokamak surfaces.
Nuclear Materials and Energy. Roč. 25, December (2020), č. článku 100818. E-ISSN 2352-1791
R&D Projects: GA MŠMT(CZ) EF16_013/0001551
EU Projects: European Commission(XE) 633053 - EUROfusion
Institutional support: RVO:61389021
Keywords : Melt motion * Schottky effect * Secondary electron emission * Thermionic emission * Tungsten * Virtual cathode
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 2.320, year: 2020
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S2352179120300922?via%3Dihub
Permanent Link: http://hdl.handle.net/11104/0314225 - 3.0510248 - ÚPT 2020 RIV US eng J - Journal Article
Abrams, K.J. - Dapor, M. - Stehling, N. - Azzolini, M. - Kyle, S.J. - Schäfer, J.S. - Quade, A. - Mika, Filip - Krátký, Stanislav - Pokorná, Zuzana - Konvalina, Ivo - Mehta, D. - Black, K. - Rodenburg, C.
Making Sense of Complex Carbon and Metal/Carbon Systems by Secondary Electron Hyperspectral Imaging.
Advanced Science. Roč. 6, č. 19 (2019), č. článku 1900719. E-ISSN 2198-3844
R&D Projects: GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : carbon orientations * carbon surface analysis * characterization * modeling * secondary electron emission * secondary electron hyperspectral imaging * secondary electron spectroscopy
OECD category: Coating and films
Impact factor: 15.840, year: 2019
Method of publishing: Open access
https://onlinelibrary.wiley.com/doi/full/10.1002/advs.201900719
Permanent Link: http://hdl.handle.net/11104/0300765 - 4.0350664 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Mika, Filip - Hovorka, Miloš - Frank, Luděk
Imaging of dopants under presence of surface ad-layers.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 35-36. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA ČR GP102/09/P543
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * semiconductor structures * image contrast * dopant concentration * secondary electron emission
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350664_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190604 - 5.0350658 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk
Mapping of dopants by electron injection.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 15-16. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA ČR GP102/09/P543; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : silicon structures * secondary electron emission * very low energy range * mapping dopants
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350658_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190598 - 6.0134102 - FZU-D 20020391 RIV CZ eng J - Journal Article
Láska, Leoš - Krása, Josef - Stöckli, M. P. - Fehrenbach, C. W.
Total electron emission from metals due to the impact of highly-charged Xe ioms with energies up to MeV.
Czechoslovak Journal of Physics. Roč. 51, č. 8 (2001), s. 791-797. ISSN 0011-4626
R&D Projects: GA AV ČR IAA1010819
Institutional research plan: CEZ:AV0Z1010921
Keywords : corpuscular diagnostic * multiply charged ions * secondary electron emission
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 0.345, year: 2001
Permanent Link: http://hdl.handle.net/11104/0000653 - 7.0133992 - FZU-D 20020280 RIV US eng J - Journal Article
Láska, Leoš - Krása, Josef - Stöckli, M. P. - Fehrenbach, C. W.
Multiply charged ion-induced secondary electron emission from metals relevent for laser source beam diagnostics.
Review of Scientific Instruments. Roč. 73, č. 2 (2002), s. 776-778. ISSN 0034-6748. E-ISSN 1089-7623
R&D Projects: GA AV ČR IAA1010819; GA AV ČR IAA1010105; GA MŠMT LN00A100
Institutional research plan: CEZ:AV0Z1010921
Keywords : ion-induced secondary electron emission * laser ion source beam diagnostics
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.437, year: 2002
Permanent Link: http://hdl.handle.net/11104/0031938 - 8.0109114 - UPT-D 20040119 CZ cze K - Conference Paper (Czech conference)
Mika, Filip
Kvantitativní studium hustoty rozložení dopantu v polovodiči pomocí emise sekundárních elektronů.
[Quantitative Study of Dopant Distribution in a Semiconductor Using Secondary Electron Emission.]
PDS 2003 - Sborník prací doktorandů prezentovaných na Semináři oddělení Elektronové optiky na počátku roku 2004. Brno: Ústav přístrojové techniky, 2004 - (Müllerová, I.), s. 39 - 42. ISBN 80-239-2268-8.
[PDS 2003 Seminář doktorandů oboru Elektronová optika. Brno (CZ), 30.01.2004]
R&D Projects: GA AV ČR KJB2065301
Institutional research plan: CEZ:AV0Z2065902
Keywords : Secondary Electron Emission * Dopant Distribution * Semiconductors
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016226 - 9.0030934 - FZÚ 2006 RIV US eng C - Conference Paper (international conference)
Láska, Leoš
Seleted results relevant to the ion diagnostics and to the characteristics of ions produced at PALS experiments.
[Vybrané výsledky související s iontovou diagnostikou a s charakteristikami iontů, produkovaných v experimentech s laserem PALS.]
PLASMA 2005: Int. Conf. on Research and Applications of Plasmas; 3rd German-Polish Conf.on Plasma Diagnostics for Fusion and Applications; 5th French-Polish Seminar on Thermal Plasma in Space and Labo. Melville: American Institut of Physics, 2005 - (Sadowski, M.), s. 96-103. AIP Conference Proceedings, 812. ISSN 0094-243X.
[PLASMA 2005. Opole-Turawa (PL), 06.09.2005-09.09.2005]
R&D Projects: GA AV ČR(CZ) IAA1010405
Institutional research plan: CEZ:AV0Z10100523
Keywords : ion diagnostics * recombination losses of ions * secondary electron emission * Thomson spectrometer * ion characteristics
Subject RIV: BL - Plasma and Gas Discharge Physics
Permanent Link: http://hdl.handle.net/11104/0131737 - 10.0001281 - FZÚ 2006 RIV SG eng C - Conference Paper (international conference)
Krása, Josef
Diagnostics for laser ion sources.
[Diagnostika pro laserové iontové zdroje.]
Plasma Production by Laser Ablation. Singapore: World Scientific, 2004 - (Gammino, S.; Mezzasalma, A.; Neri, F.; Torrisi, L.), s. 90-97. ISBN 981-238-943-1.
[PPLA 2003. Messina and Catania (IT), 18.09.2003-19.09.2003]
R&D Projects: GA MŠMT(CZ) LN00A100
Institutional research plan: CEZ:AV0Z1010921
Keywords : laser ion sources * hybride ion source with ECR * ion diagnostics * electron multipliers * microchannel plates * ion collectors without suppressed secondary electron emission
Subject RIV: BL - Plasma and Gas Discharge Physics
Permanent Link: http://hdl.handle.net/11104/0109633