Search results

  1. 1.
    0448445 - ÚPT 2016 RIV US eng C - Conference Paper (international conference)
    Lazar, Josef - Holá, Miroslava - Hrabina, Jan - Oulehla, Jindřich - Číp, Ondřej
    Interferometry within a resonant cavity with standing wave detection.
    Second International Conference on Applications of Optics and Photonics (Proceedings of SPIE 9286). Bellingham: SPIE, 2014, 92860C:1-6. ISBN 9781628413618. ISSN 0277-786X.
    [Second International Conference on Applications of Optics and Photonics. Aveiro (PT), 26.05.2014-30.05.2014]
    R&D Projects: GA MŠMT ED0017/01/01; GA MŠMT EE2.4.31.0016; GA TA ČR TA02010711; GA TA ČR TE01020233; GA ČR GPP102/11/P820
    Institutional support: RVO:68081731
    Keywords : interferometry * refractometry * metrology
    OECD category: Optics (including laser optics and quantum optics)
    Permanent Link: http://hdl.handle.net/11104/0250144
     
     
  2. 2.
    0445366 - ÚPT 2016 RIV US eng J - Journal Article
    Pikálek, Tomáš - Buchta, Zdeněk
    Air refractive index measurement using low-coherence interferometry.
    Applied Optics. Roč. 54, č. 16 (2015), s. 5024-5020. ISSN 1559-128X. E-ISSN 2155-3165
    R&D Projects: GA MŠMT ED0017/01/01; GA MŠMT(CZ) LO1212; GA ČR GB14-36681G
    Institutional support: RVO:68081731
    Keywords : updated edlen equantion * frequency combs * laser * refractometry
    Subject RIV: BH - Optics, Masers, Lasers
    Impact factor: 1.598, year: 2015
    Permanent Link: http://hdl.handle.net/11104/0247687
     
     
  3. 3.
    0441268 - ÚPT 2015 RIV US eng C - Conference Paper (international conference)
    Holá, Miroslava - Číp, Ondřej - Šarbort, Martin - Lazar, Josef
    Air flow and length noise in displacement interferometry.
    Optics and Measurement Conference 2014 (Proceedings of SPIE 9442). Bellingham: SPIE, 2014, 94420D: 1-7. ISBN 9781628415575. ISSN 0277-786X.
    [Optics and Measurement Conference 2014 (OaM 2014). Liberec (CZ), 07.10.2014-10.10.2014]
    R&D Projects: GA ČR GB14-36681G; GA TA ČR TA02010711; GA TA ČR TA01010995; GA TA ČR TE01020233; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : refractometry * refractive index of air * interferometer * measuring system
    Subject RIV: BH - Optics, Masers, Lasers
    Permanent Link: http://hdl.handle.net/11104/0245284
     
     
  4. 4.
    0434169 - ÚPT 2015 RIV US eng C - Conference Paper (international conference)
    Holá, Miroslava - Lazar, Josef - Číp, Ondřej - Buchta, Zdeněk
    In-beam tracking refractometry for coordinate interferometric measurement.
    Optical Micro- and Nanometrology V. (Proceedings of SPIE 9132). Bellingham: SPIE, 2014, 91321K: 1-7. ISSN 0277-786X.
    [Optical Micro- and Nanometrology /5./. Brussels (BE), 15.04.2014-17.04.2014]
    R&D Projects: GA ČR GPP102/11/P820; GA MŠMT ED0017/01/01; GA MŠMT EE2.4.31.0016; GA TA ČR TA02010711; GA TA ČR TE01020233; GA TA ČR TA01010995; GA MŠMT(CZ) LO1212
    Institutional support: RVO:68081731
    Keywords : refractometry * refractive index * interferometers * laser interferometry * lasers * scanning probe microscopy
    Subject RIV: BH - Optics, Masers, Lasers
    Permanent Link: http://hdl.handle.net/11104/0238305
     
     
  5. 5.
    0422036 - ÚPT 2014 FR eng C - Conference Paper (international conference)
    Lazar, Josef - Holá, Miroslava - Hrabina, Jan - Buchta, Zdeněk - Číp, Ondřej
    Interferometry with suppresion of the influence of refractive index of air for precision positioning.
    NanoScale 2013. 10th Seminar on Quantitative Microscopy (QM) and 6th Seminar on Nanoscale Calibration Standards and methods.. Paris: Nanometrology Group, 2013, s. 115.
    [NanoScale 2013. Seminar on Quantitative Microscopy (QM) /10./ and Seminar on Nanoscale Calibration Standards and Methods /6./. Paris (FR), 25.04.2013-26.04.2013]
    Institutional support: RVO:68081731
    Keywords : nanometrology * refractometry * interferometry * refractive index * nanoscale
    Permanent Link: http://hdl.handle.net/11104/0228289
     
     
  6. 6.
    0421238 - ÚPT 2014 RIV US eng C - Conference Paper (international conference)
    Holá, Miroslava - Hrabina, Jan - Oulehla, Jindřich - Čížek, Martin - Mikel, Břetislav - Řeřucha, Šimon - Buchta, Zdeněk - Číp, Ondřej - Lazar, Josef
    Precision positioning with suppression of the influence of refractive index of air.
    Optical Measurement Systems for Industrial Inspection VIII (Proceedings of SPIE Vol. 8788). Bellingham: SPIE, 2013, 878831:1-7. ISBN 978-0-8194-9604-1.
    [Optical Measurement Systems for Industrial Inspection /8./. Munich (DE), 13.05.2013-16.05.2013]
    R&D Projects: GA ČR GA102/09/1276; GA ČR GPP102/11/P820; GA TA ČR TA02010711; GA TA ČR TE01020233; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : nanometrology * refractometry * interferometry * refractive index * nanoscale
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0227647
     
     
  7. 7.
    0399809 - ÚPT 2014 RIV GB eng J - Journal Article
    Lazar, Josef - Holá, Miroslava - Číp, Ondřej - Hrabina, Jan - Oulehla, Jindřich
    Interferometric system with tracking refractometry capability in the measuring axis.
    Measurement Science and Technology. Roč. 24, č. 6 (2013), 067001:1-6. ISSN 0957-0233. E-ISSN 1361-6501
    R&D Projects: GA ČR GA102/09/1276; GA ČR GPP102/11/P820; GA TA ČR TE01020233; GA TA ČR TA02010711; GA MŠMT ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : refractometry * nanopositioning * interferometry * nanometrology
    Subject RIV: BH - Optics, Masers, Lasers
    Impact factor: 1.352, year: 2013
    Permanent Link: http://hdl.handle.net/11104/0227030
     
     
  8. 8.
    0398400 - ÚPT 2014 RIV GB eng C - Conference Paper (international conference)
    Lazar, Josef - Holá, Miroslava - Hrabina, Jan - Buchta, Zdeněk - Číp, Ondřej
    Interferometry with suppression of fast fluctuations of the refractive index of air for nanometrology.
    Sixth International Symposium on Precision Mechanical Measurements (Proceedings of SPIE 8916). Bellingham: SPIE, 2013, 89161J: 1-6. ISSN 0277-786X.
    [International Symposium on Precision Mechanical Measurements /6./. Guiyang (CN), 10.10.2013]
    R&D Projects: GA ČR GPP102/11/P820; GA MŠMT ED0017/01/01; GA MŠMT EE2.4.31.0016; GA TA ČR TA02010711; GA TA ČR TE01020233
    Institutional support: RVO:68081731
    Keywords : Nanometrology * Interferometry * Refractometry
    Subject RIV: BH - Optics, Masers, Lasers
    Permanent Link: http://hdl.handle.net/11104/0225897
     
     
  9. 9.
    0398011 - ÚPT 2014 RIV DE eng C - Conference Paper (international conference)
    Lazar, Josef - Holá, Miroslava - Hrabina, Jan - Buchta, Zdeněk - Číp, Ondřej - Oulehla, Jindřich
    Interferometry with Stabilization of Wavelength within a Fixed Measuring Range.
    Fringe 2013. 7th International Workshop on Advanced Optical Imaging and Metrology (Proceedings). Berlin: Springer-Verlag, 2014, s. 645-648. ISBN 978-3-642-36358-0.
    [International Workshop on Advanced Optical Imaging and Metrology /7./. Nürtingen (DE), 08.09.2013-11.09.2013]
    R&D Projects: GA ČR GPP102/11/P820; GA MŠMT ED0017/01/01; GA MŠMT EE2.4.31.0016; GA TA ČR TA02010711; GA TA ČR TE01020233
    Institutional support: RVO:68081731
    Keywords : Nanometrology * refractometry * interferometry * rafractive index
    Subject RIV: BH - Optics, Masers, Lasers
    Permanent Link: http://hdl.handle.net/11104/0225588
     
     
  10. 10.
    0386128 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
    Lazar, Josef - Holá, Miroslava - Hrabina, Jan - Buchta, Zdeněk - Číp, Ondřej
    Precision displacement interferometry with stabilization of wavelength on air.
    Optics and Measurement 2012. Proceedings of the International Conference. Praha: Institute of Plasma Physics, 2012 - (Vít, T.; Kovačičinová, J.; Lédl, V.), s. 81-85. ISBN 978-80-87026-02-1.
    [Optics and Measurement 2012. Liberec (CZ), 16.10.2012-18.10.2012]
    R&D Projects: GA ČR GA102/09/1276; GA TA ČR TA02010711; GA TA ČR TE01020233; GA MŠMT ED0017/01/01; GA ČR GPP102/11/P820
    Institutional support: RVO:68081731
    Keywords : Refractometry * nanopositioning * interferometry * nanometrology
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0215508
     
     

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