Search results

  1. 1.
    0538009 - FZÚ 2021 RIV GB eng J - Journal Article
    Marčišovská, M. - Dudas, D. - Havránek, M. - Kabátová, A. - Kafka, V. - Kostina, A. - Macková, A. - Marcisovský, M. - Mitrofanov, S. V. - Popule, Jiří - Romanenko, Oleksandr V. - Tomášek, L. - Vrba, V.
    TID and SEU testing of the novel X-CHIP-03 monolithic pixel detector.
    Journal of Instrumentation. Roč. 15, č. 1 (2020), s. 1-11, č. článku C01043. ISSN 1748-0221. E-ISSN 1748-0221
    R&D Projects: GA MŠMT EF16_013/0001812
    Institutional support: RVO:68378271 ; RVO:61389005
    Keywords : radiation damage to detector materials (solid state) * radiation damage to electronic components * radiation-hard detectors * radiation-hard electronics
    OECD category: Particles and field physics; Nuclear physics (UJF-V)
    Impact factor: 1.415, year: 2020
    Method of publishing: Limited access
    https://doi.org/10.1088/1748-0221/15/01/C01043
    Permanent Link: http://hdl.handle.net/11104/0315849
     
     
  2. 2.
    0519329 - FZÚ 2020 RIV GB eng J - Journal Article
    Marčišovská, Mária - Benka, T. - Havránek, Miroslav - Hejtmánek, M. - Janoška, Z. - Kafka, V. - Marcisovský, M. - Neue, G. - Popule, Jiří - Svihra, P. - Tomášek, L. - Vančura, P. - Vrba, V.
    A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies.
    Journal of Instrumentation. Roč. 13, č. 12 (2018), s. 1-10, č. článku C12003. ISSN 1748-0221. E-ISSN 1748-0221
    Institutional support: RVO:68378271
    Keywords : radiation damage to electronic components * radiation-hard detectors * radiation-hard electronics * solid state detectors
    OECD category: Particles and field physics
    Impact factor: 1.366, year: 2018
    Method of publishing: Limited access
    https://doi.org/10.1088/1748-0221/13/12/c12003
    Permanent Link: http://hdl.handle.net/11104/0304325
     
     
  3. 3.
    0443408 - ÚJF 2016 RIV GB eng J - Journal Article
    Kushpil, Svetlana - Kushpil, Vasilij - Mikhaylov, Vasily
    Setup for laboratory studies of the environmental conditions influence on the fixed charge state in silicon dioxide.
    Journal of Instrumentation. Roč. 10, FEB (2015), C02045. ISSN 1748-0221. E-ISSN 1748-0221
    R&D Projects: GA MŠMT(CZ) LG13031; GA MŠMT(CZ) LM2011019
    Institutional support: RVO:61389005
    Keywords : control and monitor systems online * radiation damage to electronic components
    Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
    Impact factor: 1.310, year: 2015
    Permanent Link: http://hdl.handle.net/11104/0246142
     
     


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