Search results
- 1.0532029 - ÚPT 2021 RIV JO eng J - Journal Article
Knápek, Alexandr - Drozd, Michal - Matějka, Milan - Chlumská, Jana - Král, Stanislav - Kolařík, Vladimír
Automated System for Optical Inspection of Defects in Resist-coated Non-patterned Wafer.
Jordan Journal of Physics. Roč. 13, č. 2 (2020), s. 93-100. ISSN 1994-7607. E-ISSN 1994-7615
R&D Projects: GA MPO FV10618
Institutional support: RVO:68081731
Keywords : optical inspection * resist layer * non-patterned wafer * quality control
OECD category: Automation and control systems
Method of publishing: Open access
http://journals.yu.edu.jo/jjp/JJPIssues/Vol13No2pdf2020/1.html
Permanent Link: http://hdl.handle.net/11104/0310631 - 2.0480581 - FGÚ 2018 RIV CZ cze P1 - User Module
Matějka, Roman - Procházka, Václav - Ižák, Tibor - Štěpanovská, Jana - Kromka, Alexander - Trávníčková, Martina - Bačáková, Lucie
Kultivační komora pro in-vitro opticko-elektrické monitorování biologických kultur s impedančními opticky-transparentními diamantovými elektrodami.
[A cultivation chamber for in-vitro optical-electrical monitoring of biological cultures with impedance optical-transparent diamond electrodes.]
2017. Owner: Fyzikální ústav AV ČR, v. v. i. - Fyziologický ústav AV ČR, v. v. i. Date of the utility model acceptance: 18.05.2017. Utility model number: 30691
R&D Projects: GA MZd(CZ) NV15-33018A
Institutional support: RVO:67985823 ; RVO:68378271
Keywords : cultivation chamber * optical inspection * diamond electrode
OECD category: Biomaterials (as related to medical implants, devices, sensors)
http://spisy.upv.cz/UtilityModels/FullDocuments/FDUM0030/uv030691.pdf
Permanent Link: http://hdl.handle.net/11104/0276329 - 3.0450639 - ÚPT 2016 RIV US eng J - Journal Article
Šarbort, Martin - Řeřucha, Šimon - Holá, Miroslava - Buchta, Zdeněk - Lazar, Josef
Self-referenced interferometer for cylindrical surfaces.
Applied Optics. Roč. 54, č. 33 (2015), s. 9930-9938. ISSN 1559-128X. E-ISSN 2155-3165
R&D Projects: GA MŠMT ED0017/01/01; GA ČR GA15-18430S; GA MŠMT(CZ) LO1212; GA TA ČR TE01020233
Institutional support: RVO:68081731
Keywords : metrological instrumentation * interferometric imaging * interferometry * surface measurements * optical inspection
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.598, year: 2015
Permanent Link: http://hdl.handle.net/11104/0251998