Search results
- 1.0205641 - UPT-D 20030023 RIV US eng J - Journal Article
Mika, Filip - Ryšávka, J. - Lopour, F. - Zadražil, M. - Müllerová, Ilona - Frank, Luděk
Computer Controlled Low Energy SEM.
Microscopy and Microanalysis. Roč. 9, Sup. 3 (2003), s. 116 - 117. ISSN 1431-9276. E-ISSN 1435-8115.
[MC 2003. Dresden, 07.09.2003-12.09.2003]
R&D Projects: GA AV ČR IBS2065017
Institutional research plan: CEZ:AV0Z2065902
Keywords : low energy SEM * scanning electron microscope * non-conductive specimens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.648, year: 2003
Permanent Link: http://hdl.handle.net/11104/0101254 - 2.0205566 - UPT-D 20020116 RIV CZ cze M - Monography Chapter
Autrata, Rudolf - Jirák, Josef
Environmentální rastrovací elektronová mikroskopie.
[Environmental scanning electron microscope.]
Medoty analýzy povrchů. Iontové, sondové a speciální metody. Praha: Academia, 2002 - (Frank, L.; Král, J.), s. 459 - 484. ISBN 80-200-0594-3
R&D Projects: GA AV ČR IBS2065107
Institutional research plan: CEZ:AV0Z2065902
Keywords : collision ions * non-conductive specimens * ESEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101179 - 3.0205490 - UPT-D 20020040 RIV CZ eng C - Conference Paper (international conference)
Romanovský, Vladimír - El-Gomati, M.
Electrostatic mini SLEEM for surface studies.
Proceedings of the 2nd annual meeting of the Czechoslovak microscopy society. Brno: CSMS, 2002 - (Frank, L.), s. 95 - 96. ISBN 80-238-8749-1.
[CSEM. Vranovská Ves (CZ), 08.02.2002-09.02.2002]
Institutional research plan: CEZ:AV0Z2065902
Keywords : low-energy electrons * charging effect * non-conductive specimens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101103