Search results
- 1.0333617 - ÚPT 2010 RIV GB eng J - Journal Article
Müllerová, Ilona - Konvalina, Ivo
Collection of secondary electrons in scanning electron microscopes.
Journal of Microscopy. Roč. 236, č. 3 (2009), s. 203-210. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA MŠMT OE08012; GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : detection of electrons * magnetic lenses * secondary electrons * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.612, year: 2009
Permanent Link: http://hdl.handle.net/11104/0178559 - 2.0205500 - UPT-D 20020050 RIV CZ eng C - Conference Paper (international conference)
Lencová, Bohumila
Is this BEM useful for the computation of magnetic lenses?
Proceedings of the 8th international seminar, held in Skalský dvůr. Brno: Ústav přístrojové techniky Akademie věd České republiky, 2002 - (Frank, L.), s. 15 - 16. ISBN 80-238-8986-9.
[Recent trends in charged particle optics and surface physics instrumentation. Skalský dvůr (CZ), 08.07.2002-12.07.2002]
Institutional research plan: CEZ:AV0Z2065902
Keywords : boundary element method * magnetic lenses
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101113