Search results
- 1.0494372 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Radlička, Tomáš - Kolařík, V. - Oral, Martin
Electron optical properties of a new low-energy scanning electron microscope with beam separator.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 64-65. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : low energy scanning electron microscopy * beam separation * aberrations
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0287628 - 2.0494360 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Mikmeková, Šárka - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
Very low energy electron transmission spectromicroscopy.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 14-15. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : low energy scanning electron microscopy * electron microscopy * time of flight * electron energy lost spectroscopy
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0287590 - 3.0437839 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Mikmeková, Eliška - Frank, Luděk
Examination of Graphene with Very Slow Electrons.
NANOCON 2014. 6th International conference proceedings. Ostrava: TANGER, 2014. ISBN 978-80-87294-55-0.
[NANOCON 2014. International Conference /6./. Brno (CZ), 05.11.2014-07.11.2014]
R&D Projects: GA TA ČR TE01020118; GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : graphene * slow electrons * very low energy scanning electron microscopy * ultralow energy STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0241324 - 4.0386397 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk
Imaging the local density of electronic states by very low energy electron reflectivity.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 57-58. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
Institutional support: RVO:68081731
Keywords : very low energy scanning electron microscopy * reflectivity of slow electrons * crystalography orientation
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0215696 - 5.0386393 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Mikmeková, Šárka - Müllerová, Ilona - Frank, Luděk
Characterization of industrial materials by slow and very slow electrons.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 45-46. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
Institutional support: RVO:68081731
Keywords : low energy scanning electron microscopy * complex steels * microstructure of materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0215702 - 6.0352430 - ÚPT 2011 SG eng A - Abstract
Frank, Luděk - Radlička, Tomáš - Konvalina, Ivo - Müllerová, Ilona
Very low energy scanning electron microscopy.
Eighth International Conference on Charged Particle Optics CPO-8. Singapore: National University of Singapore, 2010. s. 98-99.
[CPO /8./ International Conference on Charged Particle Optics. 12.07.2010-16.07.2010, Singapore]
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : very low energy scanning electron microscopy * cathode lens * BSE detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0191937 - 7.0340747 - ÚPT 2010 RIV JP eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Hanzlíková, Renáta - Frank, Luděk
Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films.
Materials Transactions. Roč. 51, č. 2 (2010), s. 265-270. ISSN 1345-9678. E-ISSN 1347-5320
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : low energy scanning electron microscopy * thin foils * transmission of very slow electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.779, year: 2010
http://www.jim.or.jp/journal/e/51/02/265.html
Permanent Link: http://hdl.handle.net/11104/0183928 - 8.0340743 - ÚPT 2010 RIV JP eng J - Journal Article
Pokorná, Zuzana - Frank, Luděk
Mapping the Local Density of States by Very-Low-Energy Scanning Electron Microscope.
Materials Transactions. Roč. 51, č. 2 (2010), s. 214-218. ISSN 1345-9678. E-ISSN 1347-5320
Institutional research plan: CEZ:AV0Z20650511
Keywords : density of states * scanning low energy electron microscopy * aluminum * very-low-energy scanning electron microscopy * electron band structure
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.779, year: 2010
http://www.jim.or.jp/journal/e/51/02/214.html
Permanent Link: http://hdl.handle.net/11104/0183925 - 9.0043765 - ÚPT 2007 RIV US eng J - Journal Article
Zobačová, Jitka - Zobač, Martin - Oral, Martin - Müllerová, Ilona - Frank, Luděk
Corrections of Magnification and Focusing in a Cathode Lens-Equipped Scanning Electron Microscope.
[Korekce zvětšení a zaostření v rastrovacím elektronovém mikroskopu s katodovou čočkou.]
Scanning. Roč. 28, č. 3 (2006), s. 155-163. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA AV ČR KJB2065301
Institutional research plan: CEZ:AV0Z20650511
Keywords : low-energy scanning electron microscopy (SEM) * cathode lens * critical dimension measurement in SEM * automatic corrections
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.462, year: 2006
Permanent Link: http://hdl.handle.net/11104/0136677