Search results
- 1.0450825 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Frank, Luděk - Mikmeková, Eliška
Graphene examined with very slow electrons.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 182-183. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : graphene * 2D crystals * ultra-low-energy STEM * ultra-low-energy SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0252038 - 2.0434115 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Knápek, Alexandr - Jašek, O. - Prášek, J. - Majzlíková, P.
Imaging of carbon nanostructures by low energy STEM below 5 keV.
18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7.
[International Microscopy Congres /18./. Praha (CZ), 07.09.2014-12.09.2014]
R&D Projects: GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : low energy STEM * carbon nanostructures
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0238252 - 3.0434106 - ÚPT 2015 RIV CZ eng C - Conference Paper (international conference)
Frank, Luděk - Nebesářová, J. - Müllerová, Ilona
Ultra-low-energy STEM in SEM.
18th International Microscopy Congres. Proceedings. Praha: Czechoslovak Microscopy Society, 2014. ISBN 978-80-260-6720-7.
[International Microscopy Congres /18./. Praha (CZ), 07.09.2014-12.09.2014]
R&D Projects: GA TA ČR TE01020118
Institutional support: RVO:68081731
Keywords : tissue section * biological STEM * low energy STEM * low energy electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0238241 - 4.0422788 - ÚPT 2014 CZ eng K - Conference Paper (Czech conference)
Frank, Luděk - Nebesářová, Jana - Vancová, Marie - Paták, Aleš - Müllerová, Ilona
Very low energy STEM for biology.
Mikroskopie 2013. Praha: Československá mikroskopická společnost, 2013, s. 19.
[Mikroskopie 2013. Lednice (CZ), 13.05.2013-14.05.2013]
R&D Projects: GA TA ČR TE01020118; GA ČR GAP108/11/2270; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : tissue sections * ultra-low-energy STEM * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0229236 - 5.0395127 - ÚPT 2014 RIV GB eng J - Journal Article
Mikmeková, Eliška - Bouyanfif, H. - Lejeune, M. - Müllerová, Ilona - Hovorka, Miloš - Unčovský, M. - Frank, Luděk
Very low energy electron microscopy of graphene flakes.
Journal of Microscopy. Roč. 251, č. 2 (2013), s. 123-127. ISSN 0022-2720. E-ISSN 1365-2818
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : graphene * very low energy STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.150, year: 2013
Permanent Link: http://hdl.handle.net/11104/0225233 - 6.0385193 - ÚPT 2013 RIV CH eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - Mikmeková, Šárka - Mikmeková, Eliška - Müllerová, Ilona - Pokorná, Zuzana
Scanning Electron Microscopy with Samples in an Electric Field.
Materials. Roč. 5, č. 12 (2012), s. 2731-2756. E-ISSN 1996-1944
R&D Projects: GA ČR GAP108/11/2270; GA TA ČR TE01020118; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : scanning electron microscopy * slow electrons * low energy SEM * low energy STEM * cathode lens
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.247, year: 2012
Permanent Link: http://hdl.handle.net/11104/0214527 - 7.0383741 - ÚPT 2013 RIV NL eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
A method of imaging ultrathin foils with very low energy electrons.
Ultramicroscopy. Roč. 119, AUG (2012), s. 79-81. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA AV ČR IAA100650902; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : very low energy STEM * penetration of very slow electrons * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.470, year: 2012
Permanent Link: http://hdl.handle.net/11104/0213588 - 8.0375383 - ÚPT 2012 RIV GB eng J - Journal Article
Müllerová, Ilona - Hovorka, Miloš - Mika, Filip - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
Very low energy scanning electron microscopy in nanotechnology.
International Journal of Nanotechnology. Roč. 9, 8/9 (2012), s. 695-716. ISSN 1475-7435. E-ISSN 1741-8151
R&D Projects: GA MŠMT OE08012; GA MŠMT ED0017/01/01; GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * very low energy electrons * cathode lens * grain contrast * strain contrast * imaging of participates * dopant contrast * very low energy STEM * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.087, year: 2012
Permanent Link: http://hdl.handle.net/11104/0208054 - 9.0358595 - ÚPT 2012 RIV NL eng J - Journal Article
Frank, Luděk - Hovorka, Miloš - Konvalina, Ivo - Mikmeková, Šárka - Müllerová, Ilona
Very low energy scanning electron microscopy.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 46-54. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * low energy electrons * cathode lens * very low energy STEM * grain contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
Permanent Link: http://hdl.handle.net/11104/0196580 - 10.0352509 - ÚPT 2011 RIV JP eng C - Conference Paper (international conference)
Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
Examination of Very Thin Free-standing Films with Slow Electrons.
Proceedings of 5th Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama: University of Toyama, 2010, s. 45-48. ISBN 978-4-9903248-2-7.
[JCNCS2010 /5./ Japan-China-Norway Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology. Toyama (JP), 12.09.2010-15.09.2010]
R&D Projects: GA AV ČR IAA100650902; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : very low energy STEM * penetration of very slow electrons * graphene
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192001