Search results
- 1.0397701 - ÚPT 2014 RIV SK eng J - Journal Article
Hrabina, Jan - Lazar, Josef - Holá, Miroslava - Číp, Ondřej
Investigation of Short-term Amplitude and Frequency Fluctuations of Lasers for Interferometry.
Measurement Science Review. Roč. 13, č. 2 (2013), s. 63-69. ISSN 1335-8871. E-ISSN 1335-8871
R&D Projects: GA ČR GPP102/11/P820; GA ČR GA102/09/1276; GA AV ČR KAN311610701; GA MŠMT ED0017/01/01; GA MŠMT(CZ) LC06007; GA MŠMT EE2.4.31.0016; GA TA ČR TA02010711
Institutional support: RVO:68081731
Keywords : nanometrology * laser noise * AFM * spectroscopy * interferometry
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.162, year: 2013
Permanent Link: http://hdl.handle.net/11104/0225338 - 2.0389837 - ÚPT 2014 RIV CH eng J - Journal Article
Hrabina, Jan - Lazar, Josef - Holá, Miroslava - Číp, Ondřej
Frequency Noise Properties of Lasers for Interferometry in Nanometrology.
Sensors. Roč. 13, č. 2 (2013), s. 2206-2219. E-ISSN 1424-8220
R&D Projects: GA ČR GPP102/11/P820; GA ČR GA102/09/1276; GA AV ČR KAN311610701; GA MŠMT ED0017/01/01; GA MŠMT(CZ) LC06007
Institutional support: RVO:68081731
Keywords : nanometrology * laser noise * interferometry * nanopositioning * AFM
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 2.048, year: 2013
Permanent Link: http://hdl.handle.net/11104/0218775 - 3.0386112 - ÚPT 2013 RIV US eng C - Conference Paper (international conference)
Hrabina, Jan - Lazar, Josef - Číp, Ondřej
Uncertainties of displacement measurement of nanometrology coordinate measurement machines caused by laser source fluctuations.
Optical Micro- and Nanometrology IV, (Proceedings of SPIE ). Vol. 8430. Bellingham: SPIE, 2012, 84301D:1-9. Photonic Europe 2012. ISBN 978-0-8194-9122-0. ISSN 0277-786X.
[Conference on Optical Micro- and Nanometrology IV. Brussels (BE), 16.04.2012-18.04.2012]
R&D Projects: GA MŠMT ED0017/01/01; GA MŠMT(CZ) LC06007; GA AV ČR KAN311610701; GA ČR GA102/09/1276; GA TA ČR TA02010711; GA ČR GPP102/11/P820
Institutional support: RVO:68081731
Keywords : nanometrology * interferometry * laser noise
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0215729 - 4.0385784 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Hrabina, Jan - Lazar, Josef - Číp, Ondřej
Nanometrology coordinate measurement machines uncertainties caused by frequency fluctuations of the laser.
NANOCON 2012, 4th International Conference Proceedings. Ostrava: TANGER Ltd, 2012, s. 811-816. ISBN 978-80-87294-32-1.
[NANOCON 2012. International Conference /4./. Brno (CZ), 23.10.2012-25.10.2012]
R&D Projects: GA ČR GPP102/11/P820; GA ČR GA102/09/1276; GA AV ČR KAN311610701; GA MŠMT ED0017/01/01; GA MŠMT(CZ) LC06007; GA TA ČR TA02010711; GA MŠMT EE2.4.31.0016
Institutional support: RVO:68081731
Keywords : interferometry * nanometrology * laser noise * frequency discriminator * atomic force microscopy
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0215563