Search results
- 1.0570793 - FZÚ 2024 RIV CZ eng C - Conference Paper (international conference)
Babčenko, Oleg - Bydžovská, Irena - Fait, Jan - Shagieva, Ekaterina - Ondič, Lukáš - Kromka, Alexander
Enhanced growth rate of diamond films at low temperature in focused microwave plasma system.
NANOCON 2022 Conference Proceedings. Ostrava: Tanger Ltd., 2023, s. 77-83. ISBN 978-80-88365-09-9. ISSN 2694-930X.
[14th International Conference on Nanomaterials - Research & Application - NANOCON 2022. Brno (CZ), 19.10.2022-21.10.2022]
R&D Projects: GA MŠMT(CZ) LUASK22147; GA MŠMT(CZ) EF16_019/0000760
Grant - others:AV ČR(CZ) LQ100102001; OP VVV - SOLID21(XE) CZ.02.1.01/0.0/0.0/16_019/0000760
Program: Prémie Lumina quaeruntur
Research Infrastructure: CzechNanoLab - 90110
Institutional support: RVO:68378271
Keywords : well-faceted diamonds * low temperature deposition * high growth rate * low non-diamond content * focused plasma
OECD category: Nano-materials (production and properties)
https://www.confer.cz/nanocon/2022/4587-enhanced-growth-rate-of-diamond-films-at-low-temperature-in-focused-microwave-plasma-system
Permanent Link: https://hdl.handle.net/11104/0342132 - 2.0341937 - FZÚ 2010 RIV CH eng J - Journal Article
Kočka, Jan - Mates, Tomáš - Ledinský, Martin - Stuchlíková, The-Ha - Stuchlík, Jiří - Fejfar, Antonín
A simple tool for quality evaluation of the microcrystalline silicon prepared at high growth rate.
[Jednoduchý nástroj pro určení kvality mikrokrystalického křemíku připraveného s vysokou rychlostí růstu.]
Thin Solid Films. Roč. 516, č. 15 (2008), s. 4966-4969. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA MŽP(CZ) SN/3/172/05
Keywords : microcrystalline silicon * deposition process * high growth rate * quality evaluation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.884, year: 2008
Permanent Link: http://hdl.handle.net/11104/0184778 - 3.0341936 - FZÚ 2010 RIV NL eng J - Journal Article
Kočka, Jan - Mates, Tomáš - Ledinský, Martin - Stuchlíková, The-Ha - Stuchlík, Jiří - Fejfar, Antonín
A simple quality factor for characterization of thin silicon films.
[Jednoduchý faktor kvality pro charakterizaci tenkých vrstev křemíku].]
Journal of Non-Crystalline Solids. Roč. 354, 19-25 (2008), s. 2227-2230. ISSN 0022-3093. E-ISSN 1873-4812
R&D Projects: GA MŽP(CZ) SN/3/172/05
Keywords : microcrystalline silicon * deposition process * high growth rate * quality evaluation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.449, year: 2008
Permanent Link: http://hdl.handle.net/11104/0184777 - 4.0320321 - FZÚ 2009 RIV NL eng J - Journal Article
Kočka, Jan - Mates, Tomáš - Ledinský, Martin - Stuchlíková, The-Ha - Stuchlík, Jiří - Fejfar, Antonín
A simple quality factor for characterization of thin silicon films.
[Jednoduchý faktor kvality pro charakterizaci tenkých vrstev křemíku].]
Journal of Non-Crystalline Solids. Roč. 354, 19-25 (2008), s. 2227-2230. ISSN 0022-3093. E-ISSN 1873-4812
R&D Projects: GA MŠMT(CZ) LC06040; GA ČR(CZ) GD202/05/H003; GA MŠMT LC510; GA AV ČR IAA1010413; GA AV ČR IAA1010316; GA MŽP(CZ) SN/3/172/05
Institutional research plan: CEZ:AV0Z10100521
Keywords : microcrystalline silicon * deposition process * high growth rate * quality evaluation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.449, year: 2008
Permanent Link: http://hdl.handle.net/11104/0169235 - 5.0309807 - FZÚ 2009 RIV CH eng J - Journal Article
Kočka, Jan - Mates, Tomáš - Ledinský, Martin - Stuchlíková, The-Ha - Stuchlík, Jiří - Fejfar, Antonín
A simple tool for quality evaluation of the microcrystalline silicon prepared at high growth rate.
[Jednoduchý nástroj pro určení kvality mikrokrystalického křemíku připraveného s vysokou rychlostí růstu.]
Thin Solid Films. Roč. 516, č. 15 (2008), s. 4966-4969. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA MŠMT(CZ) LC06040; GA MŽP(CZ) SN/3/172/05; GA ČR(CZ) GD202/05/H003; GA MŠMT LC510; GA AV ČR IAA1010413; GA AV ČR IAA1010316
Institutional research plan: CEZ:AV0Z10100521
Keywords : microcrystalline silicon * deposition process * high growth rate * quality evaluation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.884, year: 2008
Permanent Link: http://hdl.handle.net/11104/0161843