Search results

  1. 1.
    0570793 - FZÚ 2024 RIV CZ eng C - Conference Paper (international conference)
    Babčenko, Oleg - Bydžovská, Irena - Fait, Jan - Shagieva, Ekaterina - Ondič, Lukáš - Kromka, Alexander
    Enhanced growth rate of diamond films at low temperature in focused microwave plasma system.
    NANOCON 2022 Conference Proceedings. Ostrava: Tanger Ltd., 2023, s. 77-83. ISBN 978-80-88365-09-9. ISSN 2694-930X.
    [14th International Conference on Nanomaterials - Research & Application - NANOCON 2022. Brno (CZ), 19.10.2022-21.10.2022]
    R&D Projects: GA MŠMT(CZ) LUASK22147; GA MŠMT(CZ) EF16_019/0000760
    Grant - others:AV ČR(CZ) LQ100102001; OP VVV - SOLID21(XE) CZ.02.1.01/0.0/0.0/16_019/0000760
    Program: Prémie Lumina quaeruntur
    Research Infrastructure: CzechNanoLab - 90110
    Institutional support: RVO:68378271
    Keywords : well-faceted diamonds * low temperature deposition * high growth rate * low non-diamond content * focused plasma
    OECD category: Nano-materials (production and properties)
    https://www.confer.cz/nanocon/2022/4587-enhanced-growth-rate-of-diamond-films-at-low-temperature-in-focused-microwave-plasma-system
    Permanent Link: https://hdl.handle.net/11104/0342132
     
     
  2. 2.
    0341937 - FZÚ 2010 RIV CH eng J - Journal Article
    Kočka, Jan - Mates, Tomáš - Ledinský, Martin - Stuchlíková, The-Ha - Stuchlík, Jiří - Fejfar, Antonín
    A simple tool for quality evaluation of the microcrystalline silicon prepared at high growth rate.
    [Jednoduchý nástroj pro určení kvality mikrokrystalického křemíku připraveného s vysokou rychlostí růstu.]
    Thin Solid Films. Roč. 516, č. 15 (2008), s. 4966-4969. ISSN 0040-6090. E-ISSN 1879-2731
    R&D Projects: GA MŽP(CZ) SN/3/172/05
    Keywords : microcrystalline silicon * deposition process * high growth rate * quality evaluation
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.884, year: 2008
    Permanent Link: http://hdl.handle.net/11104/0184778
     
     
  3. 3.
    0341936 - FZÚ 2010 RIV NL eng J - Journal Article
    Kočka, Jan - Mates, Tomáš - Ledinský, Martin - Stuchlíková, The-Ha - Stuchlík, Jiří - Fejfar, Antonín
    A simple quality factor for characterization of thin silicon films.
    [Jednoduchý faktor kvality pro charakterizaci tenkých vrstev křemíku].]
    Journal of Non-Crystalline Solids. Roč. 354, 19-25 (2008), s. 2227-2230. ISSN 0022-3093. E-ISSN 1873-4812
    R&D Projects: GA MŽP(CZ) SN/3/172/05
    Keywords : microcrystalline silicon * deposition process * high growth rate * quality evaluation
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.449, year: 2008
    Permanent Link: http://hdl.handle.net/11104/0184777
     
     
  4. 4.
    0320321 - FZÚ 2009 RIV NL eng J - Journal Article
    Kočka, Jan - Mates, Tomáš - Ledinský, Martin - Stuchlíková, The-Ha - Stuchlík, Jiří - Fejfar, Antonín
    A simple quality factor for characterization of thin silicon films.
    [Jednoduchý faktor kvality pro charakterizaci tenkých vrstev křemíku].]
    Journal of Non-Crystalline Solids. Roč. 354, 19-25 (2008), s. 2227-2230. ISSN 0022-3093. E-ISSN 1873-4812
    R&D Projects: GA MŠMT(CZ) LC06040; GA ČR(CZ) GD202/05/H003; GA MŠMT LC510; GA AV ČR IAA1010413; GA AV ČR IAA1010316; GA MŽP(CZ) SN/3/172/05
    Institutional research plan: CEZ:AV0Z10100521
    Keywords : microcrystalline silicon * deposition process * high growth rate * quality evaluation
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.449, year: 2008
    Permanent Link: http://hdl.handle.net/11104/0169235
     
     
  5. 5.
    0309807 - FZÚ 2009 RIV CH eng J - Journal Article
    Kočka, Jan - Mates, Tomáš - Ledinský, Martin - Stuchlíková, The-Ha - Stuchlík, Jiří - Fejfar, Antonín
    A simple tool for quality evaluation of the microcrystalline silicon prepared at high growth rate.
    [Jednoduchý nástroj pro určení kvality mikrokrystalického křemíku připraveného s vysokou rychlostí růstu.]
    Thin Solid Films. Roč. 516, č. 15 (2008), s. 4966-4969. ISSN 0040-6090. E-ISSN 1879-2731
    R&D Projects: GA MŠMT(CZ) LC06040; GA MŽP(CZ) SN/3/172/05; GA ČR(CZ) GD202/05/H003; GA MŠMT LC510; GA AV ČR IAA1010413; GA AV ČR IAA1010316
    Institutional research plan: CEZ:AV0Z10100521
    Keywords : microcrystalline silicon * deposition process * high growth rate * quality evaluation
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 1.884, year: 2008
    Permanent Link: http://hdl.handle.net/11104/0161843
     
     


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