Search results
- 1.0508111 - ÚPT 2020 RIV NL eng J - Journal Article
Dordevic, B. - Neděla, Vilém - Tihlaříková, Eva - Trojan, V. - Havel, L.
Effects of copper and arsenic stress on the development of Norway spruce somatic embryos and their visualization with the environmental scanning electron microscope.
New Biotechnology. Roč. 48, JAN (2019), s. 35-43. ISSN 1871-6784. E-ISSN 1876-4347
R&D Projects: GA MŠMT(CZ) LO1212; GA ČR(CZ) GA14-22777S; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : copper * arsenic * somatic embryogenesis * Picea abies (L.) Karst. * environmental scanning electron microscope
OECD category: Plant sciences, botany
Impact factor: 4.674, year: 2019
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/pii/S1871678417305174?via%3Dihub
Permanent Link: http://hdl.handle.net/11104/0299099 - 2.0479450 - ÚPT 2018 RIV AT eng J - Journal Article
Vlašínová, H. - Neděla, Vilém - Dordevic, B. - Havel, J.
Bottlenecks in bog pine multiplication by somatic embryogenesis and their visualization with the environmental scanning electron microscope.
Protoplasma. Roč. 254, č. 4 (2017), s. 1487-1497. ISSN 0033-183X. E-ISSN 1615-6102
R&D Projects: GA ČR(CZ) GA14-22777S
Institutional support: RVO:68081731
Keywords : somatic embryogenesis * pinus uncinata subsp uliginosa * abnormalities * environmental scanning electron microscope
OECD category: Plant sciences, botany
Impact factor: 2.457, year: 2017
Permanent Link: http://hdl.handle.net/11104/0275440 - 3.0465200 - ÚPT 2017 RIV US eng J - Journal Article
Navrátilová, Eva - Neděla, Vilém
Characterization of Burnt Clays by X-ray Diffraction Analysis, Chemical Analysis and Environmental Scanning Electron Microscopy.
Microscopy and Microanalysis. Roč. 22, S3 (2016), s. 1862-1863. ISSN 1431-9276. E-ISSN 1435-8115
Institutional support: RVO:68081731
Keywords : burnt clays * pozzolanic activity * amorphous phase * environmental scanning electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.891, year: 2016
Permanent Link: http://hdl.handle.net/11104/0263860 - 4.0384060 - ÚPT 2013 RIV US eng J - Journal Article
Maxa, J. - Neděla, Vilém - Jirák, J.
Analysis Of Gas Flow In The New System Of Apertures In The Secondary Electron Scintillation Detector For ESEM.
Microscopy and Microanalysis. Roč. 18, Suppl. 2 (2012), s. 1264-1265. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : environmental scanning electron microscope * scintillation detector * secondary electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.495, year: 2012
Permanent Link: http://hdl.handle.net/11104/0213815 - 5.0379919 - ÚPT 2013 RIV AU eng C - Conference Paper (international conference)
Neděla, Vilém - Konvalina, Ivo - Lencová, B. - Zlámal, J. - Jirák, J.
New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes.
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22. Wembley: EECW Pty Ltd, 2012, 370:1-2. ISBN 978-1-74052-245-8.
[Asia-Pacific Microscopy Conference (APMC-10) - International Conference on Nanoscience and Nanotechnology (ICONN 2012) - Australian Conference on Microscopy and Microanalysis (ACMM-22). Perth (AU), 05.02.2012-09.02.2012]
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : environmental scanning electron microscope * detection systems * secondary electrons * backscattered electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0210770 - 6.0353053 - ÚPT 2011 CN eng A - Abstract
Neděla, Vilém - Bařinka, R. - Hladík, V. - Flodrová, Eva
Investigation of solar cell structures after laser beam processing.
Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 225.
[Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
R&D Projects: GA MPO FR-TI1/305
Institutional research plan: CEZ:AV0Z20650511
Keywords : crystalline silicon solar cells * laser confocal microscope * environmental scanning electron microscope * structures study * laser MicroJet system * fiber laser
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192401 - 7.0353052 - ÚPT 2011 CN eng A - Abstract
Neděla, Vilém - Krejčí, J. - Sajdlová, Z. - Flodrová, Eva
Study of surfaces of electrochemical sensors using optical and scanning electron microscopy.
Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 226.
[Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
R&D Projects: GA MPO FR-TI1/118
Institutional research plan: CEZ:AV0Z20650511
Keywords : electrochemical sensors * laser confocal microscope * environmental scanning electron microscope * surface study
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192400