Search results | The Czech Academy of Sciences

Records found: 2

Your query: Keywords = "electron mirror"

To the basket
RIV
DOI
WOS
SCOPUS
PUBMED
Bookmark
1.
0525112 - ÚPT 2021 RIV CH eng J - Journal Article
Skoupý, Radim - Fořt, Tomáš - Krzyžánek, Vladislav
Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration.
Nanomaterials. Roč. 10, č. 2 (2020), č. článku 332. E-ISSN 2079-4991
R&D Projects: GA ČR GA17-15451S; GA MPO(CZ) FV30271
Institutional support: RVO:68081731
Keywords : SEM * quantitative imaging * back-scattered electrons * standardless calibration * electron mirror * sample bias * Monte Carlo simulation * thin coating layers
OECD category: Nano-materials (production and properties)
Impact factor: 5.076, year: 2020
Method of publishing: Open access
https://www.mdpi.com/2079-4991/10/2/332
Permanent Link: http://hdl.handle.net/11104/0309322
To the basket
RIV
WOS
Bookmark
2.
0315455 - ÚPT 2009 RIV CZ eng C - Conference Paper (international conference)
Lencová, Bohumila
Solving Complex Electron Optical Problems with EOD.
[Řešení složitých elektronově optických problémů v EOD.]
Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2008 - (Mika, F.), s. 65-68. ISBN 978-80-254-0905-3.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /11./. Skalský dvůr (CZ), 14.07.2008-18.07.2008]
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron optical design * electron mirror * hexapole corrector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0165654