Search results
- 1.0525112 - ÚPT 2021 RIV CH eng J - Journal Article
Skoupý, Radim - Fořt, Tomáš - Krzyžánek, Vladislav
Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration.
Nanomaterials. Roč. 10, č. 2 (2020), č. článku 332. E-ISSN 2079-4991
R&D Projects: GA ČR GA17-15451S; GA MPO(CZ) FV30271
Institutional support: RVO:68081731
Keywords : SEM * quantitative imaging * back-scattered electrons * standardless calibration * electron mirror * sample bias * Monte Carlo simulation * thin coating layers
OECD category: Nano-materials (production and properties)
Impact factor: 5.076, year: 2020
Method of publishing: Open access
https://www.mdpi.com/2079-4991/10/2/332
Permanent Link: http://hdl.handle.net/11104/0309322 - 2.0491708 - ÚPT 2019 RIV NL eng J - Journal Article
Radlička, Tomáš - Unčovský, M. - Oral, Martin
In lens BSE detector with energy filtering.
Ultramicroscopy. Roč. 189, JUN (2018), s. 102-108. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : electron optics * scanning electron microscopy * back scattered electrons * energy filtering
OECD category: Electrical and electronic engineering
Impact factor: 2.644, year: 2018
Permanent Link: http://hdl.handle.net/11104/0285349