Search results
- 1.0499413 - ÚFP 2020 RIV US eng C - Conference Paper (international conference)
Psota, Pavel - Lédl, Vít - Kaván, František - Matoušek, O. - Mokrý, P.
Surface profilometry by digital holography.
IEEE International Conference on Emerging Technologies and Factory Automation. New York: IEEE, 2017, s. 1-5. ISBN 978-1-5090-6505-9. ISSN 1946-0759.
[22nd IEEE International Conference on Emerging Technologies and Factory Automation. Limassol (CY), 12.09.2017-15.09.2017]
R&D Projects: GA ČR(CZ) GA16-11965S
Institutional support: RVO:61389021
Keywords : Surface profilometry * Digital holography * Frequency scanning * Absolute measurement
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0291627 - 2.0368142 - ÚPT 2012 RIV DE eng C - Conference Paper (international conference)
Mikel, Břetislav - Čížek, Martin - Buchta, Zdeněk - Číp, Ondřej
Laser Interferometry Method with Stabilized DFB Laser Diode.
Proceedings of the 20th IMEKO TC2 Symposium on Photonics in Measurement. Aachen: Shaker Verlag, 2011, s. 21-24. ISBN 978-3-8440-0058-0.
[IMEKO TC2 Symposium on Photonics in Measurement /20./. Linz (AT), 16.05.2011-18.05.2011]
R&D Projects: GA MPO 2A-1TP1/127; GA MŠMT ED0017/01/01; GA ČR GP102/09/P293; GA ČR GP102/09/P630
Institutional research plan: CEZ:AV0Z20650511
Keywords : laser interferometry * absolute measurement * tunable laser diodes
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0202572 - 3.0353169 - ÚPT 2011 CZ eng A - Abstract
Mikel, Břetislav - Čížek, Martin - Buchta, Zdeněk - Lazar, Josef - Číp, Ondřej
Laser interferometry method with stabilized DFB laser diode at 760 nm wavelength.
NanoScale 2010. Brno: CMI, 2010. M03.
[NanoScale 2010 - 9th Seminar on Quantitative Microscopy (QM) and 5th Seminar on Nanoscale Calibration Standards and Methods. 27.10.2010-29.10.2010, Brno]
Institutional research plan: CEZ:AV0Z20650511
Keywords : laser interferometry * absolute measurement * tunable laser diodes
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0192487 - 4.0352185 - ÚPT 2011 RIV BG eng C - Conference Paper (international conference)
Mikel, Břetislav - Buchta, Zdeněk - Lazar, Josef - Číp, Ondřej
Semiconductor laser sources at 760 nm wavelength for nanometrology.
Proceedings of the 9th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronic. Sofia: WSEAS EUROPMENT Press, 2010, s. 96-101. ISBN 978-954-92600-3-8. ISSN 1790-5117.
[WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronic /9./. Catania (IT), 29.05.2010-31.10.2010]
R&D Projects: GA MPO 2A-1TP1/127; GA MŠMT ED0017/01/01; GA ČR GP102/09/P293; GA ČR GP102/09/P630
Institutional research plan: CEZ:AV0Z20650511
Keywords : laser interferometry * absolute measurement * tunable laser diodes
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191758 - 5.0350817 - ÚPT 2011 RIV US eng J - Journal Article
Mikel, Břetislav - Buchta, Zdeněk - Lazar, Josef - Číp, Ondřej
High frequency stability semiconductor laser sources at 760 nm wavelength.
WSEAS Transactions on Circuits and Systems. Roč. 9, č. 10 (2010), s. 650-659. ISSN 1109-2734
R&D Projects: GA MPO 2A-1TP1/127; GA MŠMT ED0017/01/01; GA ČR GP102/09/P293; GA ČR GP102/09/P630
Institutional research plan: CEZ:AV0Z20650511
Keywords : absolute measurement * DFB laser diode * laser interferometry * tunable laser diodes * VCSEL laser diode
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0190718 - 6.0336817 - ÚPT 2011 RIV US eng C - Conference Paper (international conference)
Mikel, Břetislav - Buchta, Zdeněk - Lazar, Josef - Číp, Ondřej
Laser sources at 760 nm wavelength for metrology of length.
Africon 2009. Los Alamitos: IEEE, 2009, 5308091: 1-6. ISBN 978-1-4244-3918-8.
[Africon 2009. Nairobi (KE), 23.09.2009-25.09.2009]
R&D Projects: GA MŠMT(CZ) LC06007; GA MŠMT 2C06012; GA AV ČR KAN311610701; GA MPO 2A-1TP1/127; GA MPO FT-TA3/133; GA MPO 2A-3TP1/113; GA ČR GA102/07/1179; GA ČR GP102/09/P293; GA ČR GP102/09/P630; GA ČR GA102/09/1276
Institutional research plan: CEZ:AV0Z20650511
Keywords : laser interferometry * absolute measurement * tunable laser diodes
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0180969