Search results
- 1.0367278 - ÚPT 2012 RIV DE eng C - Conference Paper (international conference)
Konvalina, Ivo - Hovorka, Miloš - Müllerová, Ilona
Electron optical properties of a focusing magnetic/immersion-magnetic lens combined with a cathode lens.
MC 2011 - Microscopy Conference Kiel. Kiel: DGE, 2011, IM1.112:1-2. ISBN 978-3-00-033910-3.
[MC 2011 - Microscopy Conference. Kiel (DE), 28.08.2011-02.09.2011]
R&D Projects: GA AV ČR IAA100650902; GA MPO FR-TI1/305; GA MPO FR-TI1/118
Institutional research plan: CEZ:AV0Z20650511
Keywords : cathode lens * aberration coefficients * spot size
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0202018 - 2.0358594 - ÚPT 2012 RIV NL eng J - Journal Article
Konvalina, Ivo - Müllerová, Ilona
Properties of the cathode lens combined with a focusing magnetic/immersion-magnetic lens.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 645, č. 1 (2011), s. 55-59. ISSN 0168-9002. E-ISSN 1872-9576
R&D Projects: GA ČR GAP102/10/1410; GA AV ČR IAA100650902; GA MŠMT ED0017/01/01
Institutional research plan: CEZ:AV0Z20650511
Keywords : cathode lens * compound objective lens * aberration coefficients * spot size * field calculations
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.207, year: 2011
Permanent Link: http://hdl.handle.net/11104/0196579 - 3.0350668 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Oral, Martin
Ray tracing, aberration coefficients and intensity distribution.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 49-52. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : ray tracing * aberration coefficients * intensity distribution
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350668_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190608 - 4.0333615 - ÚPT 2010 RIV NL eng J - Journal Article
Oral, Martin - Lencová, Bohumila
Calculation of aberration coefficients by ray tracing.
Ultramicroscopy. Roč. 109, č. 11 (2009), s. 1365-1373. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : Aberrations * Aberration coefficients * Ray tracing * Regression * Fitting
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.067, year: 2009
Permanent Link: http://hdl.handle.net/11104/0178557 - 5.0314212 - ÚPT 2009 RIV NL eng J - Journal Article
Lencová, Bohumila - Lenc, M. - Hawkes, P. W.
A pitfall in the calculation of higher order aberrations.
[Skryté nebezpečí při výpočtu aberací vyšších řádů.]
Ultramicroscopy. Roč. 108, č. 8 (2008), s. 737-740. ISSN 0304-3991. E-ISSN 1879-2723
Institutional research plan: CEZ:AV0Z20650511
Keywords : aberration coefficients
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.629, year: 2008
Permanent Link: http://hdl.handle.net/11104/0164793 - 6.0050994 - ÚPT 2007 cze K - Conference Paper (Czech conference)
Oral, Martin
Určení přesných trajektorií nabitých částic a vad soustav v částicové optice.
[Determination of exact charged-particle trajectories and aberrations of systems in particle optics.]
PDS 2006 - Sborník prací doktorandů oboru Elektronová optika. Brno: ÚPT AV ČR, 2006, s. 45-48. ISBN 80-239-7957-4.
[PDS 2006. Brno (CZ), 19.12.2006]
Institutional research plan: CEZ:AV0Z20650511
Keywords : direct ray tracing * aberrations * aberration coefficients * intensity distribution
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0140996