Search results
- 1.0353046 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
Jirák, J. - Čudek, P. - Neděla, Vilém
Detection of Secondary Electrons by Scintillation Detector in Variable Pressure Scanning Electron Microscopes.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I10.14: 1-2. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
R&D Projects: GA ČR GAP102/10/1410
Institutional research plan: CEZ:AV0Z20650511
Keywords : VPSEM * scintillation detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192396 - 2.0353039 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
Neděla, Vilém - Jirák, J.
Newly Designed Ionisation Secondary Electron Detector with Electrostatic Separators for VP-ESEM.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I10.9: 1-2. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
R&D Projects: GA ČR GAP102/10/1410
Institutional research plan: CEZ:AV0Z20650511
Keywords : ISEDS * VPSEM * ESEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0192389 - 3.0315080 - ÚPT 2009 RIV DE eng C - Conference Paper (international conference)
Jirák, Josef - Černoch, P. - Neděla, Vilém - Špinka, J.
Scintillation SE Detector for Variable Pressure Scanning Electron Microscope.
[Scintilační detektor sekundárních elektronů pro vysokotlaký rastrovací elektronový mikroskop.]
EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods. Berlin: Springer, 2008 - (Luysberg, M.; Tillmann, K.; Weirich, T.), s. 559-560. ISBN 978-3-540-85154-7.
[EMC 2008 - European Microscopy Congress /14./. Aachen (DE), 01.09.2008-05.09.2008]
Institutional research plan: CEZ:AV0Z20650511
Keywords : VPSEM * secondary electrons detector * scintillatíon detector
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0004851