Search results
- 1.0518094 - ÚPT 2020 RIV cze P1 - User Module
Krutil, Vojtěch - Dupák, Libor - Fořt, Tomáš - Matějka, Milan - Srnka, Aleš - Vlček, Ivan - Urban, Pavel
Držák vzorků s elektrickým kontaktováním.
[Sample holder with electrical contact.]
2019. Owner: Ústav přístrojové techniky AV ČR, v. v. i. Date of the utility model acceptance: 03.12.2019. Utility model number: 33444
R&D Projects: GA TA ČR TE01020233
Institutional support: RVO:68081731
Keywords : cryogenic sample holder * UHV SEM/SPM microscope * electrical contacts
OECD category: Mechanical engineering
https://isdv.upv.cz/webapp/!resdb.pta.frm
Permanent Link: http://hdl.handle.net/11104/0303278 - 2.0509126 - ÚPT 2020 RIV FR eng C - Conference Paper (international conference)
Krutil, Vojtěch - Dupák, Libor - Fořt, Tomáš - Matějka, Milan - Srnka, Aleš - Vlček, Ivan - Urban, Pavel
Design of Cryogenic Sample Holder with Electrical Contacts for UHV SEM/SPM.
15th Cryogenics 2019 IIR International Conference. Proceedings. Paris: IIR, 2019, s. 369-377. Refrigeration Science and Technology. ISBN 978-2-36215-025-8. ISSN 0151-1637.
[IIR International Conference on Cryogenics /15./. Prague (CZ), 08.04.2019-11.04.2019]
R&D Projects: GA TA ČR TE01020233
Institutional support: RVO:68081731
Keywords : cryogenic sample holder * UHV SEM/SPM microscope * spring-loaded electrical contacts * transport pallet
OECD category: Mechanical engineering
Permanent Link: http://hdl.handle.net/11104/0299911 - 3.0205406 - UPT-D 20010046 RIV IT eng C - Conference Paper (international conference)
Müllerová, Ilona - Frank, Luděk - El Gomati, M. M.
SLEEM Imaging of Doping Patterns in Semiconductors.
Proceedings of 5th Multinational Congress on Electron Microscopy. Lecce: Rinton Press, 2001 - (Dini, L.; Catalano, M.), s. 317-318. ISBN 1-58949-003-7.
[MCEM '01 /5./ - Multinational Congress on Electron Microscopy. Lecce (IT), 20.09.2001-25.09.2001]
R&D Projects: GA AV ČR IAA1065901
Institutional research plan: CEZ:AV0Z2065902
Keywords : UHV SEM * low energy range
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101020