Search results
- 1.0446422 - FGÚ 2016 RIV DE eng J - Journal Article
Sjövall, P. - Rossmeisl, Martin - Hanrieder, J. - Kuda, Ondřej - Kopecký, Jan - Bryhn, M.
Dietary uptake of omega-3 fatty acids in mouse tissue studied by time-of-flight secondary ion mass spectrometry (TOF-SIMS).
Analytical and Bioanalytical Chemistry. Roč. 407, č. 17 (2015), s. 5101-5111. ISSN 1618-2642. E-ISSN 1618-2650
R&D Projects: GA ČR(CZ) GA14-09347S
Institutional support: RVO:67985823
Keywords : Omega-3 * TOF-SIMS * mouse tissue * lipids Imaging * PCA
Subject RIV: FB - Endocrinology, Diabetology, Metabolism, Nutrition
Impact factor: 3.125, year: 2015
Permanent Link: http://hdl.handle.net/11104/0248420 - 2.0442464 - ÚFE 2015 RIV GB eng J - Journal Article
Lorinčík, Jan - Kašík, Ivan - Vaniš, Jan - Sedláček, L. - Dluhoš, J.
Imaging of dopant distribution in optical fibers with an orthogonal TOF SIMS.
Surface and Interface Analysis. Roč. 46, č. 1 (2014), s. 238-240. ISSN 0142-2421. E-ISSN 1096-9918.
[19th International Conference on Secondary Ion Mass Spectrometry (SIMS). Jeju, 29.09.2013-04.10.2013]
Grant - others:GA AV ČR(CZ) M100761202
Institutional support: RVO:67985882
Keywords : TOF SIMS * Optical fibers * Dopant
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.245, year: 2014
Permanent Link: http://hdl.handle.net/11104/0245274File Download Size Commentary Version Access UFE 0442464.pdf 5 432.7 KB Other require - 3.0386396 - ÚPT 2013 RIV CZ eng C - Conference Paper (international conference)
Oral, Martin
Fast simulation of ToF spectrometers.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 51-54. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
R&D Projects: GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : ToF SIMS * fast simulation method
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0215695