Search results
- 1.0575427 - ÚPT 2024 RIV GB eng A - Abstract
Müllerová, Ilona - Konvalina, Ivo - Zouhar, Martin - Paták, Aleš - Daniel, Benjamin - Průcha, Lukáš - Piňos, Jakub - Materna Mikmeková, Eliška
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1861-1862. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
R&D Projects: GA ČR(CZ) GA22-34286S
Grant - others:AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy (SLEEM) * time-of-flight spectroscopy * graphene
OECD category: Electrical and electronic engineering
https://academic.oup.com/mam/article/29/Supplement_1/1861/7229038
Permanent Link: https://hdl.handle.net/11104/0345212 - 2.0568495 - ÚPT 2023 RIV CZ eng A - Abstract
Průcha, Lukáš - Lejeune, M. - Kizovský, Martin - Materna Mikmeková, Eliška
Combining Low Energy Electron Microscopy and Thermal Raman Spectroscopy for Graphene Analysis.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 166-167. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : graphene * SLEEM * Raman Spectroscopy
OECD category: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0339795 - 3.0567527 - ÚPT 2023 CZ eng A - Abstract
Zouhar, Martin - Daniel, Benjamin - Konvalina, Ivo - Paták, Aleš - Piňos, Jakub - Materna Mikmeková, Eliška
Effective IMFP of thin samples via the time-of-flight method.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 168. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
R&D Projects: GA ČR(CZ) GA22-34286S
Institutional support: RVO:68081731
Keywords : time‑of‑flight spectrometer * SLEEM * inelastic mean free path
OECD category: Electrical and electronic engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0338780 - 4.0567515 - ÚPT 2023 CZ eng A - Abstract
Piňos, Jakub - Frank, Luděk
Real Time Observation of strain in the SEM copper sample.
16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022 - (Krzyžánek, V.; Hrubanová, K.; Hozák, P.; Müllerová, I.; Šlouf, M.). s. 351-352. ISBN 978-80-11-02253-2.
[Multinational Congress on Microscopy /16./. 04.09.2022-09.09.2022, Brno]
Grant - others:AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : SEM * SLEEM * deformation
OECD category: Materials engineering
https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf
Permanent Link: https://hdl.handle.net/11104/0338768 - 5.0552268 - ÚPT 2022 CZ eng A - Abstract
Mikmeková, Šárka - Konvalina, Ivo - Müllerová, Ilona - Matsuda, K. - Ikeno, S.
Prospect of advanced microscopy in material research.
15th International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) expanded to Geo-Eerth Science & Civil Design / Engineering (ES&CDE). Abstract book. Institute of Scientific Instruments of the CAS: Brno, 2021. s. 88.
[International Conference on the Physical Properties and Application of Advanced Materials (ICPMAT) /15./. 18.10.2021-19.10.2021, online]
Institutional support: RVO:68081731
Keywords : SEM * SLEEM * advanced steels * light metals
https://icpmat2021.com/_files/200001189-a9feaa9fec/icpmat-2021-abstract-book.pdf
Permanent Link: http://hdl.handle.net/11104/0327400 - 6.0549396 - ÚPT 2022 RIV NL eng J - Journal Article
Mikmeková, Šárka - Aoyama, T.
Effect of native oxide on the crystal orientation contrast in SEM micrographs obtained at hundreds, tens and units of eV.
Ultramicroscopy. Roč. 220, January (2021), č. článku 113144. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : SLEEM * Crystallographic contrast * Low-energy electrons * Mirror microscopy * Work function * Surface potential
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 2.994, year: 2021
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S0304399120302928?via%3Dihub
Permanent Link: http://hdl.handle.net/11104/0325415 - 7.0544223 - ÚPT 2022 RIV US eng J - Journal Article
Ma, Haili - Mikmeková, Šárka - Konvalina, Ivo - Yin, X. - Sun, F. - Piňos, Jakub - Vaškovicová, Naděžda - Průcha, Lukáš - Müllerová, Ilona - Mikmeková, Eliška - Chen, D.
Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices.
ACS Applied Nano Materials. Roč. 4, č. 4 (2021), s. 3725-3733. ISSN 2574-0970
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : scanning low-energy electron microscopy (SLEEM) * BiFeO3 nanoscale films * ferroelectric nanodomains * low-loss backscattered electrons * multiferroic
OECD category: Electrical and electronic engineering
Impact factor: 6.140, year: 2021
Method of publishing: Limited access
https://pubs.acs.org/doi/10.1021/acsanm.1c00204
Permanent Link: http://hdl.handle.net/11104/0321265 - 8.0522221 - ÚPT 2020 US eng A - Abstract
Mikmeková, Šárka - Jánský, P. - Kolařík, V. - Müllerová, Ilona
Surface imaging with UHV SLEEM and SEM LEEM.
Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 444-445. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : surface imaging * UHV SLEEM * SEM LEEM
OECD category: Materials engineering
Permanent Link: http://hdl.handle.net/11104/0306716 - 9.0507183 - ÚPT 2020 RIV GB eng C - Conference Paper (international conference)
Kasl, J. - Mikmeková, Šárka - Jandová, D.
SEM, TEM and SLEEM (scanning low energy electron microscopy) of CB2 steel after creep testing.
EMAS 2013 workshop. 13th Europhean workshop on modern developments and applications in microbeam analysis. Bristol: IOP, 2014, č. článku 012008. IOP Conference Series-Materials Science and Engineering. ISSN 1757-8981.
[European Workshop of the European-Microbeam-Analysis-Society on Modern Developments and Applications in Microbeam Analysis (EMAS) /13./. Porto (PT), 12.05.2013-16.05.2013]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : SEM * SLEEM
OECD category: Nano-materials (production and properties)
Permanent Link: http://hdl.handle.net/11104/0298363 - 10.0494370 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Piňos, Jakub - Frank, Luděk
Real time observation of strain in the SEM sample.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 58-59. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
Institutional support: RVO:68081731
Keywords : SEM * SLEEM * deformation
OECD category: Materials engineering
Permanent Link: http://hdl.handle.net/11104/0287626