Search results
- 1.0522221 - ÚPT 2020 US eng A - Abstract
Mikmeková, Šárka - Jánský, P. - Kolařík, V. - Müllerová, Ilona
Surface imaging with UHV SLEEM and SEM LEEM.
Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 444-445. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : surface imaging * UHV SLEEM * SEM LEEM
OECD category: Materials engineering
Permanent Link: http://hdl.handle.net/11104/0306716 - 2.0481029 - ÚPT 2018 JP eng A - Abstract
Müllerová, Ilona - Mikmeková, Šárka - Mikmeková, Eliška - Konvalina, Ivo - Pokorná, Zuzana - Frank, Luděk
Characterisation of materials by scanning low energy electron microscope.
3rd Forum of Center for Advanced Materials Research and International Collaboration (CAMRIC-FORAM3). 13th Light Metals International Workshop By Japan Institute of Light Metals. Toyama: University of Toyama, 2017. s. 14-15.
[Forum of Center for Advanced Materials Research and International Collaboration (CAMRIC-FORAM3) /3./. Light Metals International Workshop By Japan Institute of Light Metals /13./. 12.10.2017-13.10.2017, Toyama]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : LEEM * ultra-fine grains * ultrahigh strength * super plasticity
OECD category: Nano-materials (production and properties)
Permanent Link: http://hdl.handle.net/11104/0276646 - 3.0466121 - ÚPT 2017 US eng A - Abstract
Frank, Luděk - Mikmeková, Eliška
Graphene examined with ultraslow electrons.
EMN Meeting on Carbon Nanostructures 2016. Program and Abstracts. Hawaii: University of Hawaii at Manoa, 2016. s. 42.
[EMN Meeting on Carbon Nanostructures 2016. 27.03.2016-31.03.2016, Hawaii]
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : LEEM * graphene * ultraslow electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0264523 - 4.0450818 - ÚPT 2016 RIV US eng J - Journal Article
Müllerová, Ilona - Mikmeková, Eliška - Frank, Luděk
Examination of Graphene in a Scanning Low Energy Electron Microscope.
Microscopy and Microanalysis. Roč. 21, S3 (2015), s. 29-30. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731
Keywords : graphene * LEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.730, year: 2015
Permanent Link: http://hdl.handle.net/11104/0257504 - 5.0385323 - ÚPT 2013 RIV NL eng J - Journal Article
Oral, Martin - Radlička, Tomáš - Lencová, B.
Effect of sample tilt on PEEM resolution.
Ultramicroscopy. Roč. 119, S1 (2012), s. 45-50. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA AV ČR IAA100650805
Institutional support: RVO:68081731
Keywords : PEEM * LEEM * Aberrations * Misalignment * Sample tilt * Point spread function * Resolution
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 2.470, year: 2012
Permanent Link: http://hdl.handle.net/11104/0214610 - 6.0350659 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Konvalina, Ivo - Hovorka, Miloš - Müllerová, Ilona
Electron optical properties of the cathode lens combined with a focusing magnetic/immersion-magnetic lens.
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010 - (Mika, F.), s. 21-22. ISBN 978-80-254-6842-5.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /12./. Skalský dvůr (CZ), 31.05.2010-04.06.2010]
R&D Projects: GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : cathode lens * PEEM * LEEM * SEM * EOD software
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://arl-repository.lib.cas.cz/uloziste_av/UPT-D/cav_un_epca-0350659_01.pdf
Permanent Link: http://hdl.handle.net/11104/0190599 - 7.0308215 - ÚPT 2008 RIV CZ eng J - Journal Article
Frank, Luděk
Beamline for Photoemission Spectromicroscopy and Spin Polarized Microscopy with Slow Electrons at CESLAB.
[Beamline pro fotoemisní spektromikroskopii a spinově polarizovanou mikroskopii s pomalými elektrony v CESLAB.]
Materials structure. Roč. 15, č. 1 (2008), s. 111-112. ISSN 1210-8529
Institutional research plan: CEZ:AV0Z20650511
Keywords : CESLAB * beamline * LEEM/PEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0160767 - 8.0133598 - FZU-D 20010398 RIV US eng J - Journal Article
Ondřejček, Michal - Appleton, R. S. - Swiech, W. - Petrova, V. L. - Flynn, C. P.
Thermally activated stripe reconstruction induced by O on Nb (011).
Physical Review Letters. Roč. 87, č. 11 (2001), s. 116102-1-116102-4. ISSN 0031-9007. E-ISSN 1079-7114
Grant - others:DOE(XX) DEF02-91ER45439
Institutional research plan: CEZ:AV0Z1010914
Keywords : STM * LEEM * Nb(011) thin films
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 6.668, year: 2001
Permanent Link: http://hdl.handle.net/11104/0031561 - 9.0088945 - ÚPT 2008 RIV NL eng J - Journal Article
Müllerová, Ilona - Matsuda, K. - Hrnčiřík, Petr - Frank, Luděk
Enhancement of SEM to scanning LEEM.
[Rozšíření SEM na rastrovací LEEM.]
Surface Science. Roč. 601, č. 20 (2007), s. 4768-4773. ISSN 0039-6028. E-ISSN 1879-2758
R&D Projects: GA ČR GA102/05/2327; GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : SEM * LEEM * scanning LEEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.855, year: 2007
Permanent Link: http://hdl.handle.net/11104/0150316 - 10.0051198 - ÚPT 2007 RIV JP eng C - Conference Paper (international conference)
Müllerová, Ilona - Hrnčiřík, Petr
Scanning Alternative to the LEEM.
[Rastrující provedení metody LEEM.]
The 5th International Conference on LEEM/PEEM. Himeji: JSRRI, 2006, s. 26.
[LEEM/PEEM /5./. Himeji (JP), 15.10.2006-19.10.2006]
R&D Projects: GA ČR GA102/05/2327
Institutional research plan: CEZ:AV0Z20650511
Keywords : LEEM * SLEEM * cathode lens * low energy electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0141121