Search results
- 1.0508172 - ÚPT 2020 RIV NL eng J - Journal Article
Skoupý, Radim - Nebesářová, Jana - Šlouf, Miroslav - Krzyžánek, Vladislav
Quantitative STEM imaging of electron beam induced mass loss of epoxy resin sections.
Ultramicroscopy. Roč. 202, JUL (2019), s. 44-50. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA ČR GA17-15451S; GA MŠMT(CZ) LM2015062; GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731 ; RVO:60077344 ; RVO:61389013
Keywords : scanning electron microscopy * scanning transmission electron microscopy * mass loss * epoxy resin * EMbed 812 resin * epon resin
OECD category: Polymer science; Optics (including laser optics and quantum optics) (BC-A); Polymer science (UMCH-V)
Impact factor: 2.452, year: 2019
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/pii/S0304399118304315?via%3Dihub
Permanent Link: http://hdl.handle.net/11104/0299148 - 2.0466095 - ÚPT 2017 CZ eng A - Abstract
Skoupý, Radim - Nebesářová, Jana - Krzyžánek, Vladislav
Temperature dependent mass loss of Epon resin sections, p 56 Keywords: Epon resin, mass loss, radiation damage, low voltage STEM, temperature.
Mikroskopie 2016. Praha: Československá mikroskopická společnost, 2016. s. 56.
[Mikroskopie 2016. 03.05.2016-04.05.2016, Lednice]
R&D Projects: GA ČR(CZ) GA14-20012S; GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : epon resin * mass loss * radiation damage * low voltage STEM * temperature
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering; JA - Electronics ; Optoelectronics, Electrical Engineering (BC-A)
Permanent Link: http://hdl.handle.net/11104/0264506 - 3.0452276 - ÚPT 2016 RIV HU eng C - Conference Paper (international conference)
Skoupý, Radim - Krzyžánek, Vladislav - Kočová, L. - Nebesářová, Jana
Electron beam induced mass loss dependence on aging of Epon resin sections.
12th Multinational Congress on Microscopy. Budapest: Akadémiai Kiadó, 2015, s. 112-113. ISBN 978-963-05-9653-4.
[MCM 2015. Multinational Congress on Microscopy /12./. Eger (HU), 23.08.2015-28.08.2015]
R&D Projects: GA ČR(CZ) GA14-20012S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731 ; RVO:60077344
Keywords : STEM * mass loss * resin * Epon
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0253305