0575427 - ÚPT 2024 RIV GB eng A - Abstract
Müllerová, Ilona - Konvalina, Ivo - Zouhar, Martin - Paták, Aleš - Daniel, Benjamin - Průcha, Lukáš - Piňos, Jakub - Materna Mikmeková, Eliška
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1861-1862. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
R&D Projects: GA ČR(CZ) GA22-34286S
Grant - others:AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy (SLEEM) * time-of-flight spectroscopy * graphene
OECD category: Electrical and electronic engineering
https://academic.oup.com/mam/article/29/Supplement_1/1861/7229038
Permanent Link: https://hdl.handle.net/11104/0345212
Müllerová, Ilona - Konvalina, Ivo - Zouhar, Martin - Paták, Aleš - Daniel, Benjamin - Průcha, Lukáš - Piňos, Jakub - Materna Mikmeková, Eliška
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 1861-1862. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
R&D Projects: GA ČR(CZ) GA22-34286S
Grant - others:AV ČR(CZ) StrategieAV21/26
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy (SLEEM) * time-of-flight spectroscopy * graphene
OECD category: Electrical and electronic engineering
https://academic.oup.com/mam/article/29/Supplement_1/1861/7229038
Permanent Link: https://hdl.handle.net/11104/0345212