0538151 - ÚFP 2021 RIV GB eng J - Journal Article
Novotný, L. - Čeřovský, Jaroslav - Dhyani, P. - Ficker, O. - Havránek, M. - Hejtmánek, M. - Janoška, Z. - Kafka, V. - Kulkov, S. - Marčišovská, M. - Marcisovský, M. - Neue, G. - Svihra, P. - Svoboda, V. - Tomášek, L. - Tunkl, M. - Vrba, V.
Runaway electron diagnostics using silicon strip detector.
Journal of Instrumentation. Roč. 15, č. 7 (2020), č. článku C07015. ISSN 1748-0221. E-ISSN 1748-0221
R&D Projects: GA ČR(CZ) GA18-02482S
Institutional support: RVO:61389021
Keywords : Runaway electrons * silicon strip detector
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 1.415, year: 2020
Method of publishing: Limited access
https://iopscience.iop.org/article/10.1088/1748-0221/15/07/C07015/pdf
Permanent Link: http://hdl.handle.net/11104/0315973
Novotný, L. - Čeřovský, Jaroslav - Dhyani, P. - Ficker, O. - Havránek, M. - Hejtmánek, M. - Janoška, Z. - Kafka, V. - Kulkov, S. - Marčišovská, M. - Marcisovský, M. - Neue, G. - Svihra, P. - Svoboda, V. - Tomášek, L. - Tunkl, M. - Vrba, V.
Runaway electron diagnostics using silicon strip detector.
Journal of Instrumentation. Roč. 15, č. 7 (2020), č. článku C07015. ISSN 1748-0221. E-ISSN 1748-0221
R&D Projects: GA ČR(CZ) GA18-02482S
Institutional support: RVO:61389021
Keywords : Runaway electrons * silicon strip detector
OECD category: Fluids and plasma physics (including surface physics)
Impact factor: 1.415, year: 2020
Method of publishing: Limited access
https://iopscience.iop.org/article/10.1088/1748-0221/15/07/C07015/pdf
Permanent Link: http://hdl.handle.net/11104/0315973