0534937 - ÚPT 2021 RIV NL eng J - Journal Article
Stopka, Jan
Analytical formulae for trajectory displacement in electron beam and generalized slice method.
Ultramicroscopy. Roč. 217, OCT (2020), č. článku 113050. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : coulomb interaction * trajectory displacement * electron optics * slice method * Holtzmark regime * pencil-beam regime
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 2.689, year: 2020
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/abs/pii/S0304399120302011
Permanent Link: http://hdl.handle.net/11104/0313066
Stopka, Jan
Analytical formulae for trajectory displacement in electron beam and generalized slice method.
Ultramicroscopy. Roč. 217, OCT (2020), č. článku 113050. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : coulomb interaction * trajectory displacement * electron optics * slice method * Holtzmark regime * pencil-beam regime
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 2.689, year: 2020
Method of publishing: Limited access
https://www.sciencedirect.com/science/article/abs/pii/S0304399120302011
Permanent Link: http://hdl.handle.net/11104/0313066