0508751 - ÚPT 2020 RIV CH eng J - Journal Article
Konvalina, Ivo - Mika, Filip - Krátký, Stanislav - Materna Mikmeková, Eliška - Müllerová, Ilona
In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM.
Materials. Roč. 12, č. 14 (2019), č. článku 2307. E-ISSN 1996-1944
R&D Projects: GA TA ČR(CZ) TE01020118; GA TA ČR TE01020233; GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : band-pass filter of signal electrons * SE detection * trajectory simulations
OECD category: Electrical and electronic engineering
Impact factor: 3.057, year: 2019
Method of publishing: Open access
https://www.mdpi.com/1996-1944/12/14/2307/htm
Permanent Link: http://hdl.handle.net/11104/0299576
Konvalina, Ivo - Mika, Filip - Krátký, Stanislav - Materna Mikmeková, Eliška - Müllerová, Ilona
In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM.
Materials. Roč. 12, č. 14 (2019), č. článku 2307. E-ISSN 1996-1944
R&D Projects: GA TA ČR(CZ) TE01020118; GA TA ČR TE01020233; GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : band-pass filter of signal electrons * SE detection * trajectory simulations
OECD category: Electrical and electronic engineering
Impact factor: 3.057, year: 2019
Method of publishing: Open access
https://www.mdpi.com/1996-1944/12/14/2307/htm
Permanent Link: http://hdl.handle.net/11104/0299576