0480451 - ÚPT 2018 RIV GB eng J - Journal Article
Řeřucha, Šimon - Yacoot, A. - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej
Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode.
Measurement Science and Technology. Roč. 28, č. 4 (2017), s. 1-11, č. článku 045204. ISSN 0957-0233. E-ISSN 1361-6501
R&D Projects: GA ČR GB14-36681G; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA TA ČR TE01020233
Institutional support: RVO:68081731
Keywords : optical metrology * DBR laser diode * frequency stabilization * laser interferometry * dimensional metrology * iodine stabilization * displacement measurement
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 1.685, year: 2017
Permanent Link: http://hdl.handle.net/11104/0276231
Řeřucha, Šimon - Yacoot, A. - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej
Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode.
Measurement Science and Technology. Roč. 28, č. 4 (2017), s. 1-11, č. článku 045204. ISSN 0957-0233. E-ISSN 1361-6501
R&D Projects: GA ČR GB14-36681G; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA TA ČR TE01020233
Institutional support: RVO:68081731
Keywords : optical metrology * DBR laser diode * frequency stabilization * laser interferometry * dimensional metrology * iodine stabilization * displacement measurement
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 1.685, year: 2017
Permanent Link: http://hdl.handle.net/11104/0276231