0368827 - ÚPT 2012 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Hovorka, Miloš - Mikmeková, Šárka - Pokorná, Zuzana - Mikmeková, Eliška - Frank, Luděk
Scanning Very Low Energy Electron Microscopy.
NANOCON 2011. 3rd International Conference. Ostrava: Tanger spol. s r. o, 2011, s. 238-243. ISBN 978-80-87294-27-7.
[NANOCON 2011. International Conference /3./. Brno (CZ), 21.09.2011-23.09.2011]
R&D Projects: GA ČR GAP108/11/2270; GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * low energy electrons * grain contrast * transmitted electrons * dopant contrast * thin films
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0203060
Müllerová, Ilona - Hovorka, Miloš - Mikmeková, Šárka - Pokorná, Zuzana - Mikmeková, Eliška - Frank, Luděk
Scanning Very Low Energy Electron Microscopy.
NANOCON 2011. 3rd International Conference. Ostrava: Tanger spol. s r. o, 2011, s. 238-243. ISBN 978-80-87294-27-7.
[NANOCON 2011. International Conference /3./. Brno (CZ), 21.09.2011-23.09.2011]
R&D Projects: GA ČR GAP108/11/2270; GA AV ČR IAA100650902
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning electron microscopy * low energy electrons * grain contrast * transmitted electrons * dopant contrast * thin films
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0203060