0322843 - ÚPT 2009 RIV GB eng C - Conference Paper (international conference)
Bartušek, Karel - Fiala, P. - Dohnal, P.
The Measurement of Temperature Characteristics of Cu Bulk Resistivity.
[Měření teplotní závislosti rezistivity Cu.]
Proceedings of PIERS 2008 in Cambridge. Cambridge: The Electromagnetics Academy, 2008, s. 827-831. ISBN 978-1-934142-06-6. ISSN 1559-9450.
[Progress In Electromagnetics Research Symposium - PIERS 2008. Cambridge (GB), 02.07.2008-06.07.2008]
Institutional research plan: CEZ:AV0Z20650511
Keywords : resistivity * temperature dependence of resistivity * Kelvins probe * cryotechnics
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0170983
Bartušek, Karel - Fiala, P. - Dohnal, P.
The Measurement of Temperature Characteristics of Cu Bulk Resistivity.
[Měření teplotní závislosti rezistivity Cu.]
Proceedings of PIERS 2008 in Cambridge. Cambridge: The Electromagnetics Academy, 2008, s. 827-831. ISBN 978-1-934142-06-6. ISSN 1559-9450.
[Progress In Electromagnetics Research Symposium - PIERS 2008. Cambridge (GB), 02.07.2008-06.07.2008]
Institutional research plan: CEZ:AV0Z20650511
Keywords : resistivity * temperature dependence of resistivity * Kelvins probe * cryotechnics
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0170983