0205668 - UPT-D 20030050 RIV CZ eng K - Conference Paper (Czech conference)
Mika, Filip
Scanning electron microscopy with low energy electrons.
Proceedings of the 9th Conference and Competition Student EEICT 2003 - Papers written by postgraduate students. Brno: Brno University of Technology, 2003 - (Řezáč, D.; Zacios, D.), s. 485 - 489. ISBN 80-214-2379-X.
[STUDENT EEICT 2003. Brno (CZ), 24.04.2003]
R&D Projects: GA AV ČR KJB2065301
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscopy * critical energy * nonconductors
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101281
Mika, Filip
Scanning electron microscopy with low energy electrons.
Proceedings of the 9th Conference and Competition Student EEICT 2003 - Papers written by postgraduate students. Brno: Brno University of Technology, 2003 - (Řezáč, D.; Zacios, D.), s. 485 - 489. ISBN 80-214-2379-X.
[STUDENT EEICT 2003. Brno (CZ), 24.04.2003]
R&D Projects: GA AV ČR KJB2065301
Institutional research plan: CEZ:AV0Z2065902
Keywords : scanning electron microscopy * critical energy * nonconductors
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0101281