0133868 - FZU-D 20020047 RIV GB eng J - Journal Article
Glinchuk, M. D. - Eliseev, E. A. - Deineka, Alexander - Jastrabík, Lubomír - Suchaneck, G. - Sandner, T. - Gerlach, G. - Hrabovský, Miroslav
Optical refraction index and polarization profile of ferroelectric thin films.
Integrated Ferroelectrics. Roč. 38, 1-4 (2001), s. 101-110. ISSN 1058-4587. E-ISSN 1607-8489
R&D Projects: GA MŠMT LN00A015; GA ČR GA202/00/1425
Institutional research plan: CEZ:AV0Z1010914
Keywords : thin film * refraction index * polarization * film thickness
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 0.512, year: 2001
Permanent Link: http://hdl.handle.net/11104/0031819
Glinchuk, M. D. - Eliseev, E. A. - Deineka, Alexander - Jastrabík, Lubomír - Suchaneck, G. - Sandner, T. - Gerlach, G. - Hrabovský, Miroslav
Optical refraction index and polarization profile of ferroelectric thin films.
Integrated Ferroelectrics. Roč. 38, 1-4 (2001), s. 101-110. ISSN 1058-4587. E-ISSN 1607-8489
R&D Projects: GA MŠMT LN00A015; GA ČR GA202/00/1425
Institutional research plan: CEZ:AV0Z1010914
Keywords : thin film * refraction index * polarization * film thickness
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 0.512, year: 2001
Permanent Link: http://hdl.handle.net/11104/0031819