0598459 - FZÚ 2025 RIV NL eng J - Journal Article
Cichoň, Stanislav - More Chevalier, Joris - Wdowik, U. D. - de Prado, Esther - Bulíř, Jiří - Novotný, Michal - Fekete, Ladislav - Duchoň, Jan - Legut, D. - Lančok, Ján
Environmental stability and ageing of ScN thin films from XPS Ar⁺ depth profiling.
Applied Surface Science. Roč. 674, Nov (2024), č. článku 160867. ISSN 0169-4332. E-ISSN 1873-5584
R&D Projects: GA ČR(CZ) GA23-07228S; GA MŠMT LM2023051
Research Infrastructure: e-INFRA CZ II - 90254
Institutional support: RVO:68378271
Keywords : ScN * thin film * oxidation * hydrolysis * X-ray photoelectron spectroscopy * ageing
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 6.9, year: 2024 ; AIS: 0.917, rok: 2024
Method of publishing: Limited access
Result website:
https://doi.org/10.1016/j.apsusc.2024.160867DOI: https://doi.org/10.1016/j.apsusc.2024.160867
Permanent Link: https://hdl.handle.net/11104/0356137