0548884 - ÚPT 2022 RIV US eng C - Conference Paper (international conference)
Řeřucha, Šimon - Holá, Miroslava - Šarbort, Martin - Kůr, J. - Konečný, P. - Lazar, Josef - Číp, Ondřej
Laser-interferometric nanometre comparator for length gauge calibration in advanced manufacturing.
2021 International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME). New York: IEEE, 2021, (2021). ISBN 978-166541262-9.
[International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME) 2021. Mauritius (MU), 07.10.2021-08.10.2021]
R&D Projects: GA TA ČR(CZ) FW03010687; GA TA ČR(CZ) TN01000008; GA MŠMT(CZ) EF16_026/0008460; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA MPO(CZ) FV10336
Institutional support: RVO:68081731
Keywords : length calibration * laser interferometry * optical metrology * dimensional measurement * advanced manufacturing
OECD category: Electrical and electronic engineering
Result website:
https://ieeexplore.ieee.org/document/9590989/DOI: https://doi.org/10.1109/ICECCME52200.2021.9590989
Permanent Link: http://hdl.handle.net/11104/0326436
Řeřucha, Šimon - Holá, Miroslava - Šarbort, Martin - Kůr, J. - Konečný, P. - Lazar, Josef - Číp, Ondřej
Laser-interferometric nanometre comparator for length gauge calibration in advanced manufacturing.
2021 International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME). New York: IEEE, 2021, (2021). ISBN 978-166541262-9.
[International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME) 2021. Mauritius (MU), 07.10.2021-08.10.2021]
R&D Projects: GA TA ČR(CZ) FW03010687; GA TA ČR(CZ) TN01000008; GA MŠMT(CZ) EF16_026/0008460; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA MPO(CZ) FV10336
Institutional support: RVO:68081731
Keywords : length calibration * laser interferometry * optical metrology * dimensional measurement * advanced manufacturing
OECD category: Electrical and electronic engineering
Result website:
https://ieeexplore.ieee.org/document/9590989/DOI: https://doi.org/10.1109/ICECCME52200.2021.9590989
Permanent Link: http://hdl.handle.net/11104/0326436