0537579 - FZÚ 2021 RIV CZ eng C - Conference Paper (international conference)
Čtvrtlík, Radim - Václavek, L. - Tomáštík, J.
Why monitor acoustic emissions during nanomechanical tests?
Acta Polytechnica CTU Proceedings. Vol. 27. Prague: Czech Technical University in Prague, 2020, s. 126-130. ISBN 978-80-01-06735-2. ISSN 2336-5382.
[International Conference on Local Mechanical Properties /14./. Prague (CZ), 06.11.2019-08.11.2019]
Institutional support: RVO:68378271
Keywords : acoustic emission * indentation * scratch test * thin films
OECD category: Optics (including laser optics and quantum optics)
Permanent Link: http://hdl.handle.net/11104/0315401
Čtvrtlík, Radim - Václavek, L. - Tomáštík, J.
Why monitor acoustic emissions during nanomechanical tests?
Acta Polytechnica CTU Proceedings. Vol. 27. Prague: Czech Technical University in Prague, 2020, s. 126-130. ISBN 978-80-01-06735-2. ISSN 2336-5382.
[International Conference on Local Mechanical Properties /14./. Prague (CZ), 06.11.2019-08.11.2019]
Institutional support: RVO:68378271
Keywords : acoustic emission * indentation * scratch test * thin films
OECD category: Optics (including laser optics and quantum optics)
Permanent Link: http://hdl.handle.net/11104/0315401