0307936 - ÚJF 2008 RIV NL eng J - Journal Article
Podgrabinski, T. - Hrabovská, E. - Švorčík, V. - Hnatowicz, Vladimír
Characterization of polystyrene and doped polymethylmethacrylate thin layers.
[Charakteristiky tenkých vrstev polystyrenu a dopovaného polymethylmet krystalu.]
Journal of Materials Science-Materials in Electronics. Roč. 16, 11-12 (2005), s. 761-765. ISSN 0957-4522. E-ISSN 1573-482X
R&D Projects: GA ČR GA106/03/0514
Institutional research plan: CEZ:AV0Z10480505
Keywords : dielectrical properties
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Impact factor: 0.781, year: 2005
Permanent Link: http://hdl.handle.net/11104/0160560