0092207 - ÚPT 2008 RIV CZ eng C - Conference Paper (international conference)
Konvalina, Ivo - Hovorka, Miloš - Wandrol, Petr - Mika, Filip - Müllerová, Ilona
Detection Strategies for Collection of Secondary Electrons in SEM.
[Detekční strategie pro sběr sekundárních elektronů v REM.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 91-92. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA ČR GA102/05/2327
Institutional research plan: CEZ:AV0Z20650511
Keywords : detection * secondary electrons * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0152593
Konvalina, Ivo - Hovorka, Miloš - Wandrol, Petr - Mika, Filip - Müllerová, Ilona
Detection Strategies for Collection of Secondary Electrons in SEM.
[Detekční strategie pro sběr sekundárních elektronů v REM.]
Proceedings of the 8th Multinational Congress on Microscopy. Prague: Czechoslovak Microscopy Society, 2007 - (Nebesářová, J.; Hozák, P.), s. 91-92. ISBN 978-80-239-9397-4.
[Multinational Congress on Microscopy /8./. Prague (CZ), 17.06.2007-21.06.2007]
R&D Projects: GA ČR GA102/05/2327
Institutional research plan: CEZ:AV0Z20650511
Keywords : detection * secondary electrons * SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0152593