0525112 - ÚPT 2021 RIV CH eng J - Journal Article
Skoupý, Radim - Fořt, Tomáš - Krzyžánek, Vladislav
Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration.
Nanomaterials. Roč. 10, č. 2 (2020), č. článku 332. ISSN 2079-4991. E-ISSN 2079-4991
R&D Projects: GA ČR GA17-15451S; GA MPO(CZ) FV30271
Institutional support: RVO:68081731
Keywords : SEM * quantitative imaging * back-scattered electrons * standardless calibration * electron mirror * sample bias * Monte Carlo simulation * thin coating layers
OECD category: Nano-materials (production and properties)
Impact factor: 5.076, year: 2020 ; AIS: 0.756, rok: 2020
Method of publishing: Open access
Result website:
https://www.mdpi.com/2079-4991/10/2/332DOI: https://doi.org/10.3390/nano10020332
Permanent Link: http://hdl.handle.net/11104/0309322