0444542 - ÚFP 2016 RIV US eng C - Conference Paper (international conference)
Lédl, Vít - Psota, Pavel - Vojtíšek, Petr - Doleček, Roman - Mokrý, Pavel
Holographic contouring and its limitations in nearly specularly reflecting surface measurement.
Proceedings of SPIE Vol. 9442: Optics and Measurement Conference 2014. Vol. 9442. Bellingham: SPIE-INT SOC OPTICAL ENGINEERING, 2015 - (Kovačičinová, J.; Vít, T.), 94420Q-94420Q. SPIE. ISBN 978-1-62841-557-5. ISSN 0277-786X.
[Optics and Measurement Conference 2014 (OaM 2014). Liberec (CZ), 07.10.2014-10.10.2014]
R&D Projects: GA MŠMT(CZ) LO1206
Institutional support: RVO:61389021
Keywords : Specular * Holographic contouring * Multiwavelength * Microroughness
Subject RIV: JB - Sensors, Measurment, Regulation
Result website:
http://spie.org/Publications/Proceedings/Paper/10.1117/12.2176006DOI: https://doi.org/10.1117/12.2176006
Permanent Link: http://hdl.handle.net/11104/0247052
Lédl, Vít - Psota, Pavel - Vojtíšek, Petr - Doleček, Roman - Mokrý, Pavel
Holographic contouring and its limitations in nearly specularly reflecting surface measurement.
Proceedings of SPIE Vol. 9442: Optics and Measurement Conference 2014. Vol. 9442. Bellingham: SPIE-INT SOC OPTICAL ENGINEERING, 2015 - (Kovačičinová, J.; Vít, T.), 94420Q-94420Q. SPIE. ISBN 978-1-62841-557-5. ISSN 0277-786X.
[Optics and Measurement Conference 2014 (OaM 2014). Liberec (CZ), 07.10.2014-10.10.2014]
R&D Projects: GA MŠMT(CZ) LO1206
Institutional support: RVO:61389021
Keywords : Specular * Holographic contouring * Multiwavelength * Microroughness
Subject RIV: JB - Sensors, Measurment, Regulation
Result website:
http://spie.org/Publications/Proceedings/Paper/10.1117/12.2176006DOI: https://doi.org/10.1117/12.2176006
Permanent Link: http://hdl.handle.net/11104/0247052