0525529 - ÚPT 2021 RIV NL eng J - Journal Article
Materna Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk - Paták, Aleš - Polčák, J. - Sluyterman, S. - Lejeune, M. - Konvalina, Ivo
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146873. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S0368204818302068
Permanent Link: http://hdl.handle.net/11104/0309642
Materna Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk - Paták, Aleš - Polčák, J. - Sluyterman, S. - Lejeune, M. - Konvalina, Ivo
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer.
Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020), č. článku 146873. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
EU Projects: European Commission(XE) 606988 - SIMDALEE2
Institutional support: RVO:68081731
Keywords : graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy
OECD category: Electrical and electronic engineering
Impact factor: 1.957, year: 2020
Method of publishing: Open access
https://www.sciencedirect.com/science/article/pii/S0368204818302068
Permanent Link: http://hdl.handle.net/11104/0309642