0316647 - ÚPT 2009 IT eng A - Abstract
Lazar, Josef - Klapetek, P. - Číp, Ondřej - Čížek, Martin - Šerý, Mojmír
Local probe microscopy with interferometric monitoring of the stage nanopositioning.
[Mikroskopie s lokální sondou s interferometrickým měřením polohy vzorku.]
NanoScale 2008 - 8th Seminar on Quantitative Microscopy (QM) and 4th Seminar on Nanoscale Calibration Standards and Methods. Torino: Istituto Nazionale di Ricerca Metrologica, 2008. s. 20. ISBN N.
[NanoScale 2008. 22.09.2008-23.09.2008, Torino]
Institutional research plan: CEZ:AV0Z20650511
Keywords : interferometry * local probe microscopy * nanometrology
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0166505
Lazar, Josef - Klapetek, P. - Číp, Ondřej - Čížek, Martin - Šerý, Mojmír
Local probe microscopy with interferometric monitoring of the stage nanopositioning.
[Mikroskopie s lokální sondou s interferometrickým měřením polohy vzorku.]
NanoScale 2008 - 8th Seminar on Quantitative Microscopy (QM) and 4th Seminar on Nanoscale Calibration Standards and Methods. Torino: Istituto Nazionale di Ricerca Metrologica, 2008. s. 20. ISBN N.
[NanoScale 2008. 22.09.2008-23.09.2008, Torino]
Institutional research plan: CEZ:AV0Z20650511
Keywords : interferometry * local probe microscopy * nanometrology
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0166505