Ion emission from plasmas produced by femtosecond pulses of short-wavelength free-electron laser radiation focused on massive targets: an overview and comparison with long-wavelength laser ablation

Josef Krása; Vincenzo Nassisi; Tomáš Burian; Věra Hájková; Jaromír Chalupský; Šimon Jelínek; Kateřina Frantálová; Michal Krupka; Zuzana Kuglerová; Sushil Kumar Singh; Vojtěch Vozda; Luděk Vyšín; Jan Wild; Michal Šmíd; Pablo Perez-Martin; Xiayun Pan; Marion Kühlman; Juan Pintor; Jakub Cikhardt; Matthias Dreimann; Dennis Eckermann; Felix Rosenthal; Sam M. Vinko; Alessandro Forte; Thomas Gawne; Thomas Campbell; Shenyuan Ren; YuanFeng Shi; Trevor Hutchinson; Oliver Humphries; Thomas Preston; Mikako Makita; Motoaki Nakatsutsumi; Alexander Köhler; Marion Harmand; Sven Toleikis; Kateřina Falk; Libor Juha

doi:10.1117/12.2670113

6 June 2023 Ion emission from plasmas produced by femtosecond pulses of short-wavelength free-electron laser radiation focused on massive targets: an overview and comparison with long-wavelength laser ablation

Josef Krása, Vincenzo Nassisi, Tomáš Burian, Věra Hájková, Jaromír Chalupský, Šimon Jelínek, Kateřina Frantálová, Michal Krupka, Zuzana Kuglerová, Sushil Kumar Singh, Vojtěch Vozda, Luděk Vyšín, Jan Wild, Michal Šmíd, Pablo Perez-Martin, Xiayun Pan, Marion Kühlman, Juan Pintor, Jakub Cikhardt, Matthias Dreimann, Dennis Eckermann, Felix Rosenthal, Sam M. Vinko, Alessandro Forte, Thomas Gawne, Thomas Campbell, Shenyuan Ren, YuanFeng Shi, Trevor Hutchinson, Oliver Humphries, Thomas Preston, Mikako Makita, Motoaki Nakatsutsumi, Alexander Köhler, Marion Harmand, Sven Toleikis, Kateřina Falk, Libor Juha

Author Affiliations +

Proceedings Volume 12578, Optics Damage and Materials Processing by EUV/X-ray Radiation (XDam8); 125780J (2023) https://doi.org/10.1117/12.2670113
Event: SPIE Optics + Optoelectronics, 2023, Prague, Czech Republic

Abstract

We report on ion emission from plasma produced on thick targets irradiated with nanosecond and femtosecond pulses delivered by mid-ultraviolet and soft x-ray lasers, respectively. To distinguish between different ion acceleration mechanisms, the maximum kinetic energy of ions produced under different interaction conditions is plotted versus laser fluence. The transformation of the time-of-flight detector signal into ion charge density distance-of-flight spectra makes it possible to determine the mean kinetic energy of the fastest ion groups based on the influence of the acoustic velocity of ion expansion. This allows obtaining additional characteristics of the ion production. The final energy of the group of fast ions determined using the ion sound velocity model is an order of magnitude larger in the fs-XFEL interaction than in the ns-UV one. On the contrary, the ablation yield of ions in our experiment is seven orders of magnitude greater when applying ns-UV laser pulses, not only due to higher energies of UV laser pulses, but also due to a significant difference in interaction and ion formation mechanisms.

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Josef Krása, Vincenzo Nassisi, Tomáš Burian, Věra Hájková, Jaromír Chalupský, Šimon Jelínek, Kateřina Frantálová, Michal Krupka, Zuzana Kuglerová, Sushil Kumar Singh, Vojtěch Vozda, Luděk Vyšín, Jan Wild, Michal Šmíd, Pablo Perez-Martin, Xiayun Pan, Marion Kühlman, Juan Pintor, Jakub Cikhardt, Matthias Dreimann, Dennis Eckermann, Felix Rosenthal, Sam M. Vinko, Alessandro Forte, Thomas Gawne, Thomas Campbell, Shenyuan Ren, YuanFeng Shi, Trevor Hutchinson, Oliver Humphries, Thomas Preston, Mikako Makita, Motoaki Nakatsutsumi, Alexander Köhler, Marion Harmand, Sven Toleikis, Kateřina Falk, and Libor Juha "Ion emission from plasmas produced by femtosecond pulses of short-wavelength free-electron laser radiation focused on massive targets: an overview and comparison with long-wavelength laser ablation", Proc. SPIE 12578, Optics Damage and Materials Processing by EUV/X-ray Radiation (XDam8), 125780J (6 June 2023); https://doi.org/10.1117/12.2670113

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