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The structural studies and optical characteristics of phase-segregated Ir-doped LuFeO3−δ films

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Abstract

In this work, we carefully examined how Ir substitution into Fe sites can change the band of the LuFeO3 (LFO) material. LFO and Ir-doped LFO (LuFe1−xIrxO3 or LFIO for short, where x = 0.05 and 0.10) thin films were synthesized by utilizing magnetron sputtering techniques. The films were grown on silicon and indium tin oxide (ITO) substrates at 500 °C. The crystallographic orientation of the films was examined using X-ray diffraction (XRD) analysis. The crystallographic orientation of the thin films was examined using an X-ray diffractometer (XRD). For surface topography research, atomic force microscopy (AFM) was employed. To look for the recombination of photogenerated electron–hole pairs in the materials under investigation, photoluminescence (PL) spectroscopy was used. Raman spectroscopy is then utilized to gather data on crystal symmetry as well as disorders and defects in the oxide materials. It was demonstrated that the LFO band gap was altered from 2.35 to 2.72 eV by Ir substitution into Fe sites. Moreover, diffuse reflectance spectroscopy (DRS) was used to analyze conductivity, real and imaginary components of the dielectric constant, refractive index (n), extinction coefficient (k), and reflectance percentage.

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The datasets generated during and/or analysed during the current study are available from the corresponding author on reasonable request.

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Acknowledgements

This work was supported by The Scientific and Technological Research Council of Turkey (TUBITAK) through Grant No: 116F025. We acknowledge the CEITEC Nano Research Infrastructure supported by MEYS CR (LM 2018110 and Istanbul Medeniyet University Science and Advanced Technology Research Center (IMU-BILTAM).

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Authors and Affiliations

  1. CEITEC BUT, Brno University of Technology, Purkyňova 123, 612 00, Brno, Czech Republic

    O. Polat & D. Sobola

  2. Institute of Physical Engineering, Brno University of Technology, Technická 2, 616 69, Brno, Czech Republic

    O. Polat

  3. Faculty of Engineering and Natural Sciences, Department of Engineering Physics, Istanbul Medeniyet University, Uskudar, 34700, Istanbul, Turkey

    F. M. Coskun, M. Coskun & A. Turut

  4. Faculty of Engineering and Natural Sciences, Department of Mechanical Engineering, Istanbul Bilgi University, Eyüpsultan, 34060, Istanbul, Turkey

    Y. Yildirim

  5. Institute of Physics of Materials, Academy of Sciences of the Czech Republic, Žižkova 22, 616 62, Brno, Czech Republic

    D. Sobola

  6. Department of Physics, Istanbul Technical University, Maslak, 34469, Istanbul, Turkey

    M. Ercelik

  7. TUBITAK UME, National Metrology Institute, P.O. Box 54, 41470, Gebze, Kocaeli, Turkey

    M. Ercelik & M. Arikan

  8. Istanbul Medeniyet University Science and Advanced Technology Research Center (IMU-BILTAM), Istanbul, Turkey

    M. Coskun & A. Turut

  9. Department of Physics, Lamar University, Beaumont, TX, 77710, USA

    C. Sen

  10. Centre for Innovation Competence (ZIK) SiLi‐nano, Martin Luther University Halle‐Wittenberg, 06120, Halle (Salle), Germany

    Z. Durmus

  11. Faculty of Science, Department of Physics, Eskisehir Technical University, Yunusemre Campus, 26470, Eskisehir, Turkey

    Y. Caglar & M. Caglar

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  1. O. Polat
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Contributions

OP conceptualization, investigation, writing—original draft, funding acquisition, and supervision. FMC: validation and investigation. YY: validation and investigation. DS: validation and investigation. ME: validation and investigation. MA: validation and investigation. MC: validation and investigation. CS: validation and investigation. ZD: validation and investigation. YC: validation and investigation. MC: review and editing, investigation, validation, and supervision. AT: review and editing, and supervision.

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Polat, O., Coskun, F.M., Yildirim, Y. et al. The structural studies and optical characteristics of phase-segregated Ir-doped LuFeO3−δ films. Appl. Phys. A 129, 198 (2023). https://doi.org/10.1007/s00339-023-06486-4

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