Optical Near-Field Electron Microscopy

0544249 - ÚFCH JH 2022 RIV US eng J - Článek v odborném periodiku
Marchand, R. - Šachl, Radek - Kalbáč, Martin - Hof, Martin - Tromp, R. - Amaro, Mariana - van der Molen, M. - Juffmann, T.
Optical Near-Field Electron Microscopy.
Physical Review Applied. Roč. 16, č. 1 (2021), č. článku 014008. ISSN 2331-7019. E-ISSN 2331-7019
Grant CEP: GA ČR(CZ) GX19-26854X
Institucionální podpora: RVO:61388955
Klíčová slova: Electron microscopy * Image resolution * Optical imaging technique * Membrane
Obor OECD: Physical chemistry
Impakt faktor: 4.931, rok: 2021
Způsob publikování: Omezený přístup

The imaging of dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical techniques damage the specimen and cause dose-induced artifacts. Here, optical near-field electron microscopy (ONEM) is proposed, an imaging technique that combines noninvasive probing with light, with a high-spatial-resolution readout via electron optics. Close to the specimen, the optical near fields are converted into a spatially varying electron flux using a planar photocathode. The electron flux is imaged using low-energy electron microscopy, enabling label-free nanometric resolution without the need to scan a probe across the sample. The specimen is never exposed to damaging electrons.
Trvalý link: http://hdl.handle.net/11104/0321279