Number of the records: 1

Apparatus for spectrum and intensity profile characterization of a beam, use thereof and method thereof

SYSNO	0552955
Title	Apparatus for spectrum and intensity profile characterization of a beam, use thereof and method thereof
Author(s)	Nejdl, Jaroslav (FZU-D)_{RID, ORCID}
Issue data	2021
Name of the owner	Fyzikální ústav AV ČR, v. v. i.
Date of the patent acceptance	09.02.2021
Patent no. or utility model no. or industrial design no.	US10914628B2
Patent category	B - USTPO (Úřad pro patenty a ochranné známky USA)
Code of the issuer name	US001 - United States Patent and Trademark Office (USPTO) Alexandria
Document Type	Patentový dokument
Grant	CZ.02.1.01/0.0/0.0/16_019/0000789, XE - EU countries
	EF16_019/0000789 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	LM2018141 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
Institutional support	FZU-D - RVO:68378271
Language	eng
Keywords	spectrometry * beam intensity profile diagnostics * XUV * X-rays
URL	https://worldwide.espacenet.com/patent/search/family/060327011/publication/US10914628B2?q=US10914628B2
Permanent Link	http://hdl.handle.net/11104/0328013

Number of the records: 1