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Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride
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SYSNO 0545328 Title Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride Author(s) Tkachenko, V. (DE)
Lipp, V. (DE)
Buescher, M. (DE)
Capotondi, F. (IT)
Hoeppner, H. (DE)
Medvedev, Nikita (FZU-D) ORCID, RID
Pedersoli, E. (IT)
Prandolini, M.J. (DE)
Rossi, G.M. (DE)
Tavella, F. (US)
Toleikis, S. (DE)
Windeler, M. (US)
Ziaja, B. (PL)
Teubner, U. (DE)Source Title Scientific Reports. Roč. 11, č. 1 (2021). - : Nature Publishing Group Article number 5203 Document Type Článek v odborném periodiku Grant 654148, XE - EU countries LTT17015 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support FZU-D - RVO:68378271 Language eng Country DE Keywords temporal diagnostics of FEL pulses * optical properties of silicon nitride irradiated by XUV and soft X-ray URL http://hdl.handle.net/11104/0322052 Permanent Link http://hdl.handle.net/11104/0322052 File Download Size Commentary Version Access 0545328.pdf 2 2.4 MB CC Licence Publisher’s postprint open-access
Number of the records: 1