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Defect structures in (001) zincblende GaN/3C-SiC nucleation layers
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SYSNO 0541992 Title Defect structures in (001) zincblende GaN/3C-SiC nucleation layers Author(s) Vacek, Petr (UFM-A) ORCID, RID
Frentrup, M. (GB)
Lee, L. Y. (GB)
Massabuau, Fabien C. P. (GB)
Kappers, Menno J. (GB)
Wallis, David J. (GB)
Gröger, Roman (UFM-A) RID, ORCID
Oliver, Rachel A. (GB)Corespondence/senior Vacek, Petr - Korespondující autor Source Title Journal of Applied Physics. Roč. 129, č. 15 (2021). - : AIP Publishing Article number 155306 Document Type Článek v odborném periodiku Grant EF16_027/0008056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic Institutional support UFM-A - RVO:68081723 Language eng Country US Keywords stacking faults * gallium nitride * transmission electron microscopy URL https://aip.scitation.org/doi/10.1063/5.0036366 Permanent Link http://hdl.handle.net/11104/0319746
Number of the records: 1