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Determination of Composition and Thickness of MnSi and MnGe Layers by EDS.

  1. 1.
    SYSNO0541357
    TitleDetermination of Composition and Thickness of MnSi and MnGe Layers by EDS.
    Author(s) Koštejn, Martin (UCHP-M) RID, SAI, ORCID
    Fajgar, Radek (UCHP-M) RID, ORCID, SAI
    Dřínek, Vladislav (UCHP-M) RID, ORCID, SAI
    Jandová, Věra (UCHP-M) RID, ORCID, SAI
    Novotný, F. (CZ)
    Corespondence/seniorKoštejn, Martin - Korespondující autor
    Source Title Journal of Nondestructive Evaluation. Roč. 39, č. 2 (2020). - : Springer
    Article number40
    Document TypeČlánek v odborném periodiku
    Grant GA18-15613S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic
    StrategieAV21/3, CZ - Czech Republic
    Institutional supportUCHP-M - RVO:67985858
    Languageeng
    CountryUS
    Keywords composition * area density * thickness
    Cooperating institutions Vysoká škola chemicko-technologická v Praze (Czech Republic)
    URLhttp://hdl.handle.net/11104/0318917
    Permanent Linkhttp://hdl.handle.net/11104/0318917
    FileDownloadSizeCommentaryVersionAccess
    0541357.pdf01.8 MBAuthor’s postprintopen-access
     
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