Direct visualization of local deformations in suspended few-layer graphene membranes by coupled in situ atomic force and scanning electron microscopy

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SYSNO	0541300
Title	Direct visualization of local deformations in suspended few-layer graphene membranes by coupled in situ atomic force and scanning electron microscopy
Author(s)	Hummel, S. (AT) Elibol, K. (AT) Zhang, D. (CN) Sampathkumar, Krishna (UFCH-W)_{ORCID, RID} Frank, Otakar (UFCH-W)_{RID, ORCID} Eder, D. (AT) Schwalb, C. (AT) Kotakoski, J. (AT) Meyer, J.C. (AT) Bayer, B. C. (AT)
Corespondence/senior	Hummel, S. - Korespondující autor Bayer, B. C. - Korespondující autor
Source Title	Applied Physics Letters. Roč. 118, č. 10 (2021). - : AIP Publishing
Article number	103104
Document Type	Článek v odborném periodiku
Grant	8J18AT005 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
Institutional support	UFCH-W - RVO:61388955
Language	eng
Country	US
Keywords	Scanning electron microscopy * Graphene * Atomic force microscopy
Cooperating institutions	Universitat Wien Shanghai University Technische Universitat Wien GETec Microscopy GmbH
URL	http://hdl.handle.net/11104/0318881
Permanent Link	http://hdl.handle.net/11104/0318881

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Number of the records: 1