Number of the records: 1  

Growth defects in WC:H layers for tribological applications

  1. 1.
    SYSNO0539174
    TitleGrowth defects in WC:H layers for tribological applications
    Author(s) Mates, Tomáš (FZU-D) RID, ORCID
    Polášek, J. (CZ)
    Mareš, P. (CZ)
    Dubau, M. (CZ)
    Vetushka, Aliaksi (FZU-D) RID, ORCID
    Ledinský, Martin (FZU-D) RID, ORCID, SAI
    Fejfar, Antonín (FZU-D) RID, ORCID, SAI
    Vyskočil, J. (CZ)
    Corespondence/seniorMates, Tomáš - Korespondující autor
    Source Title Vacuum. Roč. 178, Aug (2020), s. 1-7. - : Elsevier
    Article number109372
    Document TypeČlánek v odborném periodiku
    Grant CZ.02.1.01/0.0/0.0/16_026/0008382
    EF16_026/0008382 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2018110 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    TH03020004 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
    Institutional supportFZU-D - RVO:68378271
    Languageeng
    CountryGB
    Keywords DLC * PACVD * AFM * SEM * FIB * Raman
    URLhttps://doi.org/10.1016/j.vacuum.2020.109372
    Permanent Linkhttp://hdl.handle.net/11104/0316874
     
Number of the records: 1  

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