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Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry
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SYSNO 0538509 Title Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry Author(s) Richter, Steffen (FZU-D) ORCID
Herrfurth, O. (DE)
Espinoza Herrera, Shirly J. (FZU-D) ORCID
Rebarz, Mateusz (FZU-D) ORCID
Kloz, Miroslav (FZU-D) ORCID
Leveillee, J.A. (US)
Schleife, A. (US)
Zollner, S. (US)
Grundmann, M. (DE)
Andreasson, Jakob (FZU-D) ORCID
Schmidt-Grund, R. (DE)Source Title New Journal of Physics. Roč. 22, č. 8 (2020), s. 1-15. - : Institute of Physics Publishing Article number 083066 Document Type Článek v odborném periodiku Grant CZ.02.1.01/0.0/0.0/16_019/0000789, XE - EU countries EF16_019/0000789 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CZ.02.1.01/0.0/0.0/15_003/0000447, XE - EU countries EF15_003/0000447 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LQ1606 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support FZU-D - RVO:68378271 Language eng Country GB Keywords ZnO * time-resolved ellipsometry * ultrafast dynamics * thin oxides * oxide * semiconductor * dielectric function URL http://hdl.handle.net/11104/0316308 Permanent Link http://hdl.handle.net/11104/0316308 File Download Size Commentary Version Access 0538509.pdf 0 3.5 MB CC licence Publisher’s postprint open-access
Number of the records: 1